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Method for the determination of the capture cross sections of electrons from space-charge-limited conduction in the dark and under illumination in amorphous semiconductors
The current transport equations describing space-charge-limited conduction in the dark and under illumination in amorphous materials have been studied. With a certain number of reasonable approximations, a very simple relation in the form Y = s v X is obtained where Y and X are two quantities direct...
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Published in: | Applied physics letters 2004-07, Vol.85 (2), p.245-247 |
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container_title | Applied physics letters |
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creator | Meaudre, R. Meaudre, M. |
description | The current transport equations describing space-charge-limited conduction in the dark and under illumination in amorphous materials have been studied. With a certain number of reasonable approximations, a very simple relation in the form
Y
=
s
v
X
is obtained where
Y
and
X
are two quantities directly linked to the values of dark currents and photocurrents measured at two different voltages and
s
v
is the product of capture cross section of states near the Fermi level and thermal velocity of carriers. The model is then applied to
n
+
-
i
-
n
+
hydrogenated amorphous and polymorphous structures. |
doi_str_mv | 10.1063/1.1769584 |
format | article |
fullrecord | <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_1769584</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>apl</sourcerecordid><originalsourceid>FETCH-LOGICAL-c282t-f5c6af36b3389b372f03ab8b0f4de65e0e349fa5d749b8b33b2691cc2ccf350c3</originalsourceid><addsrcrecordid>eNp1kLtOxDAQRS0EEstCwR-4pQjYmTwbJLTiJS2igdpy_CCGJI5sp-Cb-EmcZEVHNbozd-ZqDkKXlFxTUsANvaZlUedVdoQ2lJRlApRWx2hDCIEkDugpOvP-M8o8BdignxcVWiuxtg6HVmGpgnK9GXgwdsBWL03BxzC5WJ31Hnsl5qGfp6qLws1CO9tjP3KhEtFy96GSzvQmKImFHeS0rGAzrCHcfWE-SDwNUjlsum76i4wW3ls3tnaao3pzWLfOn6MTzTuvLg51i94f7t92T8n-9fF5d7dPRFqlIdG5KLiGogGo6gbKVBPgTdUQnUlV5IooyGrNc1lmdWwDNGlRUyFSITTkRMAWXa13l3-d0mx0pufum1HCZsqMsgPl6L1dvV6YsHzwv3lFzSJqFimwBTX8AkA3ilI</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Method for the determination of the capture cross sections of electrons from space-charge-limited conduction in the dark and under illumination in amorphous semiconductors</title><source>American Institute of Physics (AIP) Publications</source><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><creator>Meaudre, R. ; Meaudre, M.</creator><creatorcontrib>Meaudre, R. ; Meaudre, M.</creatorcontrib><description>The current transport equations describing space-charge-limited conduction in the dark and under illumination in amorphous materials have been studied. With a certain number of reasonable approximations, a very simple relation in the form
Y
=
s
v
X
is obtained where
Y
and
X
are two quantities directly linked to the values of dark currents and photocurrents measured at two different voltages and
s
v
is the product of capture cross section of states near the Fermi level and thermal velocity of carriers. The model is then applied to
n
+
-
i
-
n
+
hydrogenated amorphous and polymorphous structures.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.1769584</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Applied physics letters, 2004-07, Vol.85 (2), p.245-247</ispartof><rights>2004 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c282t-f5c6af36b3389b372f03ab8b0f4de65e0e349fa5d749b8b33b2691cc2ccf350c3</citedby><cites>FETCH-LOGICAL-c282t-f5c6af36b3389b372f03ab8b0f4de65e0e349fa5d749b8b33b2691cc2ccf350c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,782,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Meaudre, R.</creatorcontrib><creatorcontrib>Meaudre, M.</creatorcontrib><title>Method for the determination of the capture cross sections of electrons from space-charge-limited conduction in the dark and under illumination in amorphous semiconductors</title><title>Applied physics letters</title><description>The current transport equations describing space-charge-limited conduction in the dark and under illumination in amorphous materials have been studied. With a certain number of reasonable approximations, a very simple relation in the form
Y
=
s
v
X
is obtained where
Y
and
X
are two quantities directly linked to the values of dark currents and photocurrents measured at two different voltages and
s
v
is the product of capture cross section of states near the Fermi level and thermal velocity of carriers. The model is then applied to
n
+
-
i
-
n
+
hydrogenated amorphous and polymorphous structures.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><recordid>eNp1kLtOxDAQRS0EEstCwR-4pQjYmTwbJLTiJS2igdpy_CCGJI5sp-Cb-EmcZEVHNbozd-ZqDkKXlFxTUsANvaZlUedVdoQ2lJRlApRWx2hDCIEkDugpOvP-M8o8BdignxcVWiuxtg6HVmGpgnK9GXgwdsBWL03BxzC5WJ31Hnsl5qGfp6qLws1CO9tjP3KhEtFy96GSzvQmKImFHeS0rGAzrCHcfWE-SDwNUjlsum76i4wW3ls3tnaao3pzWLfOn6MTzTuvLg51i94f7t92T8n-9fF5d7dPRFqlIdG5KLiGogGo6gbKVBPgTdUQnUlV5IooyGrNc1lmdWwDNGlRUyFSITTkRMAWXa13l3-d0mx0pufum1HCZsqMsgPl6L1dvV6YsHzwv3lFzSJqFimwBTX8AkA3ilI</recordid><startdate>20040712</startdate><enddate>20040712</enddate><creator>Meaudre, R.</creator><creator>Meaudre, M.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20040712</creationdate><title>Method for the determination of the capture cross sections of electrons from space-charge-limited conduction in the dark and under illumination in amorphous semiconductors</title><author>Meaudre, R. ; Meaudre, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c282t-f5c6af36b3389b372f03ab8b0f4de65e0e349fa5d749b8b33b2691cc2ccf350c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Meaudre, R.</creatorcontrib><creatorcontrib>Meaudre, M.</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Meaudre, R.</au><au>Meaudre, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Method for the determination of the capture cross sections of electrons from space-charge-limited conduction in the dark and under illumination in amorphous semiconductors</atitle><jtitle>Applied physics letters</jtitle><date>2004-07-12</date><risdate>2004</risdate><volume>85</volume><issue>2</issue><spage>245</spage><epage>247</epage><pages>245-247</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>The current transport equations describing space-charge-limited conduction in the dark and under illumination in amorphous materials have been studied. With a certain number of reasonable approximations, a very simple relation in the form
Y
=
s
v
X
is obtained where
Y
and
X
are two quantities directly linked to the values of dark currents and photocurrents measured at two different voltages and
s
v
is the product of capture cross section of states near the Fermi level and thermal velocity of carriers. The model is then applied to
n
+
-
i
-
n
+
hydrogenated amorphous and polymorphous structures.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.1769584</doi><tpages>3</tpages></addata></record> |
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ispartof | Applied physics letters, 2004-07, Vol.85 (2), p.245-247 |
issn | 0003-6951 1077-3118 |
language | eng |
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source | American Institute of Physics (AIP) Publications; American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list) |
title | Method for the determination of the capture cross sections of electrons from space-charge-limited conduction in the dark and under illumination in amorphous semiconductors |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T17%3A10%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Method%20for%20the%20determination%20of%20the%20capture%20cross%20sections%20of%20electrons%20from%20space-charge-limited%20conduction%20in%20the%20dark%20and%20under%20illumination%20in%20amorphous%20semiconductors&rft.jtitle=Applied%20physics%20letters&rft.au=Meaudre,%20R.&rft.date=2004-07-12&rft.volume=85&rft.issue=2&rft.spage=245&rft.epage=247&rft.pages=245-247&rft.issn=0003-6951&rft.eissn=1077-3118&rft.coden=APPLAB&rft_id=info:doi/10.1063/1.1769584&rft_dat=%3Cscitation_cross%3Eapl%3C/scitation_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c282t-f5c6af36b3389b372f03ab8b0f4de65e0e349fa5d749b8b33b2691cc2ccf350c3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |