Comparative study of photoluminescence of undoped and erbium-doped size-controlled nanocrystalline Si∕SiO2 multilayered structures

• Published in: Journal of applied physics 2004-08, Vol.96 (4), p.2254-2260
• Main Authors: Timoshenko, V. Yu, Lisachenko, M. G., Shalygina, O. A., Kamenev, B. V., Zhigunov, D. M., Teterukov, S. A., Kashkarov, P. K., Heitmann, J., Schmidt, M., Zacharias, M.
• Format: Article
• Language: English
• ISSN: 0021-8979; 1089-7550
• DOI: 10.1063/1.1773383

Spectra and transients of the photoluminescence (PL) of undoped and Er-doped size-controlled nanocrystalline Si∕SiO2 multilayered structures with mean nanocrystal size of 1.5–4.5nm have been comparatively investigated. The Er-doped structures exhibit a strong Er-related PL band at 0.81eV, while the efficiency of the intrinsic PL band of Si nanocrystals at 1.2–1.7eV decreases by several orders of magnitude in comparison with the undoped structures. At low temperature the PL spectra of the Er-doped structures show several dips separated by the energy of Si TO-phonon and bound to the transition energies between the second and third excited states to the ground state of Er3+. The Er-related PL is characterized by lifetimes of around 3–5ms, a weak temperature quenching, and a high efficiency, which is comparable or even stronger than that of the intrinsic PL in the corresponding undoped samples. This efficient sensitizing of the Er-related luminescence is explained by the structural properties of the samples, which favor a strong coupling between the excitons confined in Si nanocrystals and upper excited states of the Er3+ ions in the SiO2 matrix.