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Optical and electro-optical properties of submicrometer lithium niobate slab waveguides prepared by crystal ion slicing and wafer bonding
LiNbO 3 thin film crystals have been produced using crystal ion slicing and wafer bonding. Films with a thickness of 680 nm are produced on a thin layer of SiO 2 , which is deposited on a substrate with electrodes. The crystalline and optical qualities of the fabricated thin films are investigated a...
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Published in: | Applied physics letters 2004-11, Vol.85 (20), p.4603-4605 |
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container_issue | 20 |
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container_title | Applied physics letters |
container_volume | 85 |
creator | Rabiei, Payam Gunter, Peter |
description | LiNbO
3
thin film crystals have been produced using crystal ion slicing and wafer bonding. Films with a thickness of
680
nm
are produced on a thin layer of
SiO
2
, which is deposited on a substrate with electrodes. The crystalline and optical qualities of the fabricated thin films are investigated and are comparable to bulk
LiNbO
3
single crystals. The effect of thermal annealing is studied using Rutherford backscattering. The refractive indices and the electro-optical (EO) coefficient of the fabricated films are measured using prism coupling dark line spectroscopy and modified attenuated total reflection. The EO coefficient is equal to
r
33
=
31
pm
∕
V
at
λ
=
633
nm
. |
doi_str_mv | 10.1063/1.1819527 |
format | article |
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3
thin film crystals have been produced using crystal ion slicing and wafer bonding. Films with a thickness of
680
nm
are produced on a thin layer of
SiO
2
, which is deposited on a substrate with electrodes. The crystalline and optical qualities of the fabricated thin films are investigated and are comparable to bulk
LiNbO
3
single crystals. The effect of thermal annealing is studied using Rutherford backscattering. The refractive indices and the electro-optical (EO) coefficient of the fabricated films are measured using prism coupling dark line spectroscopy and modified attenuated total reflection. The EO coefficient is equal to
r
33
=
31
pm
∕
V
at
λ
=
633
nm
.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.1819527</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Applied physics letters, 2004-11, Vol.85 (20), p.4603-4605</ispartof><rights>2004 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c349t-1b9dfca6d5c0ed799713423fa5e2789478aa3e91abb0e47a5ff977eae2ba666f3</citedby><cites>FETCH-LOGICAL-c349t-1b9dfca6d5c0ed799713423fa5e2789478aa3e91abb0e47a5ff977eae2ba666f3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,778,780,782,27911,27912</link.rule.ids></links><search><creatorcontrib>Rabiei, Payam</creatorcontrib><creatorcontrib>Gunter, Peter</creatorcontrib><title>Optical and electro-optical properties of submicrometer lithium niobate slab waveguides prepared by crystal ion slicing and wafer bonding</title><title>Applied physics letters</title><description>LiNbO
3
thin film crystals have been produced using crystal ion slicing and wafer bonding. Films with a thickness of
680
nm
are produced on a thin layer of
SiO
2
, which is deposited on a substrate with electrodes. The crystalline and optical qualities of the fabricated thin films are investigated and are comparable to bulk
LiNbO
3
single crystals. The effect of thermal annealing is studied using Rutherford backscattering. The refractive indices and the electro-optical (EO) coefficient of the fabricated films are measured using prism coupling dark line spectroscopy and modified attenuated total reflection. The EO coefficient is equal to
r
33
=
31
pm
∕
V
at
λ
=
633
nm
.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><recordid>eNp1kMtOwzAQRS0EEqWw4A-8ZRGw4ySOFyxQxUuq1A2so7EzLkZ5yXap-gn8NYZmy2o0ozt35h5Crjm75awSd_yW11yVuTwhC86kzATn9SlZMMZEVqmSn5OLED5TW-ZCLMj3ZorOQEdhaCl2aKIfs3GeTX6c0EeHgY6Whp3unfFjjxE97Vz8cLueDm7UEJGGDjTdwxdud65NC5PHCTy2VB-o8YcQk58bh6Rzxg3bv3t7sMlJj0ObJpfkzEIX8GquS_L-9Pi2esnWm-fX1cM6M6JQMeNatdZA1ZaGYSuVklwUubBQYi5rVcgaQKDioDXDQkJprZISAXMNVVVZsSQ3R98UJQSPtpm868EfGs6aX4YNb2aGSXt_1AbjIsT0___iGWSTgjUzSPEDObJ9Nw</recordid><startdate>20041115</startdate><enddate>20041115</enddate><creator>Rabiei, Payam</creator><creator>Gunter, Peter</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20041115</creationdate><title>Optical and electro-optical properties of submicrometer lithium niobate slab waveguides prepared by crystal ion slicing and wafer bonding</title><author>Rabiei, Payam ; Gunter, Peter</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c349t-1b9dfca6d5c0ed799713423fa5e2789478aa3e91abb0e47a5ff977eae2ba666f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Rabiei, Payam</creatorcontrib><creatorcontrib>Gunter, Peter</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Rabiei, Payam</au><au>Gunter, Peter</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optical and electro-optical properties of submicrometer lithium niobate slab waveguides prepared by crystal ion slicing and wafer bonding</atitle><jtitle>Applied physics letters</jtitle><date>2004-11-15</date><risdate>2004</risdate><volume>85</volume><issue>20</issue><spage>4603</spage><epage>4605</epage><pages>4603-4605</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>LiNbO
3
thin film crystals have been produced using crystal ion slicing and wafer bonding. Films with a thickness of
680
nm
are produced on a thin layer of
SiO
2
, which is deposited on a substrate with electrodes. The crystalline and optical qualities of the fabricated thin films are investigated and are comparable to bulk
LiNbO
3
single crystals. The effect of thermal annealing is studied using Rutherford backscattering. The refractive indices and the electro-optical (EO) coefficient of the fabricated films are measured using prism coupling dark line spectroscopy and modified attenuated total reflection. The EO coefficient is equal to
r
33
=
31
pm
∕
V
at
λ
=
633
nm
.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.1819527</doi><tpages>3</tpages></addata></record> |
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ispartof | Applied physics letters, 2004-11, Vol.85 (20), p.4603-4605 |
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language | eng |
recordid | cdi_crossref_primary_10_1063_1_1819527 |
source | American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list); AIP Journals (American Institute of Physics) |
title | Optical and electro-optical properties of submicrometer lithium niobate slab waveguides prepared by crystal ion slicing and wafer bonding |
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