True atomic resolution in liquid by frequency-modulation atomic force microscopy

True atomic resolution of frequency-modulation atomic force microscopy in liquid is demonstrated. Hexagonal lattice of a cleaved (001) surface of muscovite mica is resolved in water. Nonperiodic structures such as defects and adsorbates are simultaneously imaged with the atomic-scale features of mic...

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Bibliographic Details
Published in:Applied physics letters 2005-07, Vol.87 (3)
Main Authors: Fukuma, Takeshi, Kobayashi, Kei, Matsushige, Kazumi, Yamada, Hirofumi
Format: Article
Language:English
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Summary:True atomic resolution of frequency-modulation atomic force microscopy in liquid is demonstrated. Hexagonal lattice of a cleaved (001) surface of muscovite mica is resolved in water. Nonperiodic structures such as defects and adsorbates are simultaneously imaged with the atomic-scale features of mica surface. The use of small oscillation amplitude (0.16–0.33 nm) of a force sensing cantilever allows us to obtain vertical and lateral resolutions of 2–6 and 300 pm, respectively, even with a low Q factor in water (Q=20–30).
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1999856