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Afterpulsing in Geiger-mode avalanche photodiodes for 1.06μm wavelength
We consider the phenomenon of afterpulsing in avalanche photodiodes (APDs) operating in gated and free-running Geiger mode. An operational model of afterpulsing and other noise characteristics of APDs predicts the noise behavior observed in the free-running mode. We also use gated-mode data to inves...
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Published in: | Applied physics letters 2006-03, Vol.88 (13) |
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creator | Jensen, K. E. Hopman, P. I. Duerr, E. K. Dauler, E. A. Donnelly, J. P. Groves, S. H. Mahoney, L. J. McIntosh, K. A. Molvar, K. M. Napoleone, A. Oakley, D. C. Verghese, S. Vineis, C. J. Younger, R. D. |
description | We consider the phenomenon of afterpulsing in avalanche photodiodes (APDs) operating in gated and free-running Geiger mode. An operational model of afterpulsing and other noise characteristics of APDs predicts the noise behavior observed in the free-running mode. We also use gated-mode data to investigate possible sources of afterpulsing in these devices. For 30-μm-diam, 1.06-μm-wavelength InGaAsP∕InP APDs operated at 290K and 4V overbias, we obtained a dominant trap lifetime of τd=0.32μs, a trap energy of 0.11eV, and a baseline dark count rate 245kHz. |
doi_str_mv | 10.1063/1.2189187 |
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E. ; Hopman, P. I. ; Duerr, E. K. ; Dauler, E. A. ; Donnelly, J. P. ; Groves, S. H. ; Mahoney, L. J. ; McIntosh, K. A. ; Molvar, K. M. ; Napoleone, A. ; Oakley, D. C. ; Verghese, S. ; Vineis, C. J. ; Younger, R. D.</creator><creatorcontrib>Jensen, K. E. ; Hopman, P. I. ; Duerr, E. K. ; Dauler, E. A. ; Donnelly, J. P. ; Groves, S. H. ; Mahoney, L. J. ; McIntosh, K. A. ; Molvar, K. M. ; Napoleone, A. ; Oakley, D. C. ; Verghese, S. ; Vineis, C. J. ; Younger, R. D.</creatorcontrib><description>We consider the phenomenon of afterpulsing in avalanche photodiodes (APDs) operating in gated and free-running Geiger mode. An operational model of afterpulsing and other noise characteristics of APDs predicts the noise behavior observed in the free-running mode. We also use gated-mode data to investigate possible sources of afterpulsing in these devices. 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An operational model of afterpulsing and other noise characteristics of APDs predicts the noise behavior observed in the free-running mode. We also use gated-mode data to investigate possible sources of afterpulsing in these devices. For 30-μm-diam, 1.06-μm-wavelength InGaAsP∕InP APDs operated at 290K and 4V overbias, we obtained a dominant trap lifetime of τd=0.32μs, a trap energy of 0.11eV, and a baseline dark count rate 245kHz.</abstract><doi>10.1063/1.2189187</doi></addata></record> |
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title | Afterpulsing in Geiger-mode avalanche photodiodes for 1.06μm wavelength |
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