Einstein-de Haas effect in a NiFe film deposited on a microcantilever

A method is presented for determining the magnetomechanical ratio g ′ in a thin ferromagnetic film deposited on a microcantilever via measurement of the Einstein-de Haas effect. An alternating magnetic field applied in the plane of the cantilever and perpendicular to its length induces bending oscil...

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Bibliographic Details
Published in:Applied physics letters 2006-09, Vol.89 (12), p.122502-122502-3
Main Authors: Wallis, T. M., Moreland, J., Kabos, P.
Format: Article
Language:English
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Summary:A method is presented for determining the magnetomechanical ratio g ′ in a thin ferromagnetic film deposited on a microcantilever via measurement of the Einstein-de Haas effect. An alternating magnetic field applied in the plane of the cantilever and perpendicular to its length induces bending oscillations of the cantilever that are measured with a fiber optic interferometer. Measurement of g ′ provides complementary information about the g factor in ferromagnetic films that is not directly available from other characterization techniques. For a 50 nm Ni 80 Fe 20 film deposited on a silicon nitride cantilever, g ′ is measured to be 1.83 ± 0.10 .
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2355445