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Combinatorial approach to thin-film transistors using multicomponent semiconductor channels: An application to amorphous oxide semiconductors in In-Ga-Zn-O system
A combinatorial approach was applied to thin-film transistors (TFTs) using amorphous In-Ga-Zn-O semiconductor channels. A large number of TFTs, having n -type channels with different chemical compositions, were fabricated simultaneously on a substrate. A systematic relation was clarified among the c...
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Published in: | Applied physics letters 2007-06, Vol.90 (24), p.242114-242114-3 |
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Language: | English |
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container_end_page | 242114-3 |
container_issue | 24 |
container_start_page | 242114 |
container_title | Applied physics letters |
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creator | Iwasaki, Tatsuya Itagaki, Naho Den, Tohru Kumomi, Hideya Nomura, Kenji Kamiya, Toshio Hosono, Hideo |
description | A combinatorial approach was applied to thin-film transistors (TFTs) using amorphous In-Ga-Zn-O semiconductor channels. A large number of TFTs, having
n
-type channels with different chemical compositions, were fabricated simultaneously on a substrate. A systematic relation was clarified among the compositional ratio of In:Ga:Zn, oxygen partial pressure in film deposition atmosphere, and TFT characteristics. The results provide an experimental basis to understand the roles of each metallic element in the In-Ga-Zn-O system. This information leads to a guideline to tune the metallic compositions for required TFT specifications. |
doi_str_mv | 10.1063/1.2749177 |
format | article |
fullrecord | <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_2749177</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>apl</sourcerecordid><originalsourceid>FETCH-LOGICAL-c394t-bdb701b6a5b4fb2ebdabe8bf41661c8197434a0d91ba3c2ab30653def25d6c983</originalsourceid><addsrcrecordid>eNp1kM1KAzEUhYMoWKsL3yBbF6nJZH5dCKX4Uyh0oxs3w00m40QmyZBkwL6OT-rUdtOFq8uB7xy4H0K3jC4Yzfk9WyRFWrGiOEMzRouCcMbKczSjlHKSVxm7RFchfE0xSzifoZ-VM0JbiM5r6DEMg3cgOxwdjp22pNW9wdGDDTpMTMBj0PYTm7GPWjozOKtsxEGZKdlmlBODZQfWqj484KXdL_ZaQtTO7kfBOD90bgzYfetGnTYD1havLXkB8mHJFoddiMpco4sW-qBujneO3p-f3lavZLN9Wa-WGyJ5lUYiGlFQJnLIRNqKRIkGhCpFm7I8Z7JkVZHyFGhTMQFcJiA4zTPeqDbJmlxWJZ-ju8Ou9C4Er9p68NqA39WM1nu5NauPcif28cAGqePfc__DJ4brg2H-C8YIh28</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Combinatorial approach to thin-film transistors using multicomponent semiconductor channels: An application to amorphous oxide semiconductors in In-Ga-Zn-O system</title><source>American Institute of Physics (AIP) Publications</source><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><creator>Iwasaki, Tatsuya ; Itagaki, Naho ; Den, Tohru ; Kumomi, Hideya ; Nomura, Kenji ; Kamiya, Toshio ; Hosono, Hideo</creator><creatorcontrib>Iwasaki, Tatsuya ; Itagaki, Naho ; Den, Tohru ; Kumomi, Hideya ; Nomura, Kenji ; Kamiya, Toshio ; Hosono, Hideo</creatorcontrib><description>A combinatorial approach was applied to thin-film transistors (TFTs) using amorphous In-Ga-Zn-O semiconductor channels. A large number of TFTs, having
n
-type channels with different chemical compositions, were fabricated simultaneously on a substrate. A systematic relation was clarified among the compositional ratio of In:Ga:Zn, oxygen partial pressure in film deposition atmosphere, and TFT characteristics. The results provide an experimental basis to understand the roles of each metallic element in the In-Ga-Zn-O system. This information leads to a guideline to tune the metallic compositions for required TFT specifications.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.2749177</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Applied physics letters, 2007-06, Vol.90 (24), p.242114-242114-3</ispartof><rights>2007 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c394t-bdb701b6a5b4fb2ebdabe8bf41661c8197434a0d91ba3c2ab30653def25d6c983</citedby><cites>FETCH-LOGICAL-c394t-bdb701b6a5b4fb2ebdabe8bf41661c8197434a0d91ba3c2ab30653def25d6c983</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.2749177$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,782,784,795,27924,27925,76383</link.rule.ids></links><search><creatorcontrib>Iwasaki, Tatsuya</creatorcontrib><creatorcontrib>Itagaki, Naho</creatorcontrib><creatorcontrib>Den, Tohru</creatorcontrib><creatorcontrib>Kumomi, Hideya</creatorcontrib><creatorcontrib>Nomura, Kenji</creatorcontrib><creatorcontrib>Kamiya, Toshio</creatorcontrib><creatorcontrib>Hosono, Hideo</creatorcontrib><title>Combinatorial approach to thin-film transistors using multicomponent semiconductor channels: An application to amorphous oxide semiconductors in In-Ga-Zn-O system</title><title>Applied physics letters</title><description>A combinatorial approach was applied to thin-film transistors (TFTs) using amorphous In-Ga-Zn-O semiconductor channels. A large number of TFTs, having
n
-type channels with different chemical compositions, were fabricated simultaneously on a substrate. A systematic relation was clarified among the compositional ratio of In:Ga:Zn, oxygen partial pressure in film deposition atmosphere, and TFT characteristics. The results provide an experimental basis to understand the roles of each metallic element in the In-Ga-Zn-O system. This information leads to a guideline to tune the metallic compositions for required TFT specifications.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNp1kM1KAzEUhYMoWKsL3yBbF6nJZH5dCKX4Uyh0oxs3w00m40QmyZBkwL6OT-rUdtOFq8uB7xy4H0K3jC4Yzfk9WyRFWrGiOEMzRouCcMbKczSjlHKSVxm7RFchfE0xSzifoZ-VM0JbiM5r6DEMg3cgOxwdjp22pNW9wdGDDTpMTMBj0PYTm7GPWjozOKtsxEGZKdlmlBODZQfWqj484KXdL_ZaQtTO7kfBOD90bgzYfetGnTYD1havLXkB8mHJFoddiMpco4sW-qBujneO3p-f3lavZLN9Wa-WGyJ5lUYiGlFQJnLIRNqKRIkGhCpFm7I8Z7JkVZHyFGhTMQFcJiA4zTPeqDbJmlxWJZ-ju8Ou9C4Er9p68NqA39WM1nu5NauPcif28cAGqePfc__DJ4brg2H-C8YIh28</recordid><startdate>20070611</startdate><enddate>20070611</enddate><creator>Iwasaki, Tatsuya</creator><creator>Itagaki, Naho</creator><creator>Den, Tohru</creator><creator>Kumomi, Hideya</creator><creator>Nomura, Kenji</creator><creator>Kamiya, Toshio</creator><creator>Hosono, Hideo</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20070611</creationdate><title>Combinatorial approach to thin-film transistors using multicomponent semiconductor channels: An application to amorphous oxide semiconductors in In-Ga-Zn-O system</title><author>Iwasaki, Tatsuya ; Itagaki, Naho ; Den, Tohru ; Kumomi, Hideya ; Nomura, Kenji ; Kamiya, Toshio ; Hosono, Hideo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c394t-bdb701b6a5b4fb2ebdabe8bf41661c8197434a0d91ba3c2ab30653def25d6c983</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Iwasaki, Tatsuya</creatorcontrib><creatorcontrib>Itagaki, Naho</creatorcontrib><creatorcontrib>Den, Tohru</creatorcontrib><creatorcontrib>Kumomi, Hideya</creatorcontrib><creatorcontrib>Nomura, Kenji</creatorcontrib><creatorcontrib>Kamiya, Toshio</creatorcontrib><creatorcontrib>Hosono, Hideo</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Iwasaki, Tatsuya</au><au>Itagaki, Naho</au><au>Den, Tohru</au><au>Kumomi, Hideya</au><au>Nomura, Kenji</au><au>Kamiya, Toshio</au><au>Hosono, Hideo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Combinatorial approach to thin-film transistors using multicomponent semiconductor channels: An application to amorphous oxide semiconductors in In-Ga-Zn-O system</atitle><jtitle>Applied physics letters</jtitle><date>2007-06-11</date><risdate>2007</risdate><volume>90</volume><issue>24</issue><spage>242114</spage><epage>242114-3</epage><pages>242114-242114-3</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>A combinatorial approach was applied to thin-film transistors (TFTs) using amorphous In-Ga-Zn-O semiconductor channels. A large number of TFTs, having
n
-type channels with different chemical compositions, were fabricated simultaneously on a substrate. A systematic relation was clarified among the compositional ratio of In:Ga:Zn, oxygen partial pressure in film deposition atmosphere, and TFT characteristics. The results provide an experimental basis to understand the roles of each metallic element in the In-Ga-Zn-O system. This information leads to a guideline to tune the metallic compositions for required TFT specifications.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.2749177</doi></addata></record> |
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title | Combinatorial approach to thin-film transistors using multicomponent semiconductor channels: An application to amorphous oxide semiconductors in In-Ga-Zn-O system |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T22%3A27%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Combinatorial%20approach%20to%20thin-film%20transistors%20using%20multicomponent%20semiconductor%20channels:%20An%20application%20to%20amorphous%20oxide%20semiconductors%20in%20In-Ga-Zn-O%20system&rft.jtitle=Applied%20physics%20letters&rft.au=Iwasaki,%20Tatsuya&rft.date=2007-06-11&rft.volume=90&rft.issue=24&rft.spage=242114&rft.epage=242114-3&rft.pages=242114-242114-3&rft.issn=0003-6951&rft.eissn=1077-3118&rft.coden=APPLAB&rft_id=info:doi/10.1063/1.2749177&rft_dat=%3Cscitation_cross%3Eapl%3C/scitation_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c394t-bdb701b6a5b4fb2ebdabe8bf41661c8197434a0d91ba3c2ab30653def25d6c983%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |