Dynamic process of dendrite fragmentation in solidification from undercooled Si melt using time-resolved x-ray diffraction

The spontaneous dendrite fragmentation in solidification from undercooled Si melt was analyzed by time-resolved two-dimensional x-ray diffractometry. For the sample solidified at Δ T = 261 K , several spots appeared at 1 ms after recalescence and the subsequent transition from spots to rings occurre...

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Bibliographic Details
Published in:Applied physics letters 2007-08, Vol.91 (6), p.061916-061916-3
Main Authors: Nagashio, K., Nozaki, K., Kuribayashi, K., Katayama, Y.
Format: Article
Language:English
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Summary:The spontaneous dendrite fragmentation in solidification from undercooled Si melt was analyzed by time-resolved two-dimensional x-ray diffractometry. For the sample solidified at Δ T = 261 K , several spots appeared at 1 ms after recalescence and the subsequent transition from spots to rings occurred within ∼ 25 ms , which suggests that the fragmentation occurred after recalescence but just at the initial stage of the plateau period. Although the present experiment supported that the driving force for the fragmentation is a capillarity effect at the plateau period, the time scale for the fragmentation differed from the current quantitative prediction.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2764114