Effect of electrode material on the resistance switching of Cu2O film

The effect of the bottom electrode material on the resistance switching characteristics was evaluated on the structure of Pt∕Cu2O/bottom electrode). It was confirmed that Ohmic or low Schottky contact is needed to induce the effective electric field for resistance switching across the Cu2O film. Pt,...

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Bibliographic Details
Published in:Applied physics letters 2007-12, Vol.91 (23)
Main Authors: Yang, Woo-Young, Rhee, Shi-Woo
Format: Article
Language:English
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Summary:The effect of the bottom electrode material on the resistance switching characteristics was evaluated on the structure of Pt∕Cu2O/bottom electrode). It was confirmed that Ohmic or low Schottky contact is needed to induce the effective electric field for resistance switching across the Cu2O film. Pt, TiN, TaN, and strontium-ruthenium oxide belong to this group. For high Schottky contact, the resistance switching characteristics could not be observed due to a large voltage drop at the rectifying interface with insufficient electric field in the Cu2O film. Also, it was confirmed that interlayer formation from the reaction at the electrode-oxide interface increased the barrier height and brought about the switching failure in the case of Ru. The resistance switching properties depend on the barrier height and the reactivity between metal and Cu2O film.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2822403