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Direct structural evidences of Mn11Ge8 and Mn5Ge2 clusters in Ge0.96Mn0.04 thin films
Mn-rich clusters in Mn-doped Ge thin films epitaxially grown on Ge (001) have been investigated by various transmission electron microscopy techniques. Both the mysterious Mn11Ge8 and the hexagonal Mn5Ge2 (a=0.72nm and c=1.3nm) clusters were confirmed to coexist in the thicker Ge0.96Mn0.04 film (80n...
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Published in: | Applied physics letters 2008-03, Vol.92 (10) |
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container_title | Applied physics letters |
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creator | Wang, Yong Zou, Jin Zhao, Zuoming Han, Xinhai Zhou, Xiaoyu Wang, Kang L. |
description | Mn-rich clusters in Mn-doped Ge thin films epitaxially grown on Ge (001) have been investigated by various transmission electron microscopy techniques. Both the mysterious Mn11Ge8 and the hexagonal Mn5Ge2 (a=0.72nm and c=1.3nm) clusters were confirmed to coexist in the thicker Ge0.96Mn0.04 film (80nm). Their possible formation mechanism is attributed to the existence of ordered stacking faults. The fact that no Mn-rich clusters found in thinner films ( |
doi_str_mv | 10.1063/1.2884527 |
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Both the mysterious Mn11Ge8 and the hexagonal Mn5Ge2 (a=0.72nm and c=1.3nm) clusters were confirmed to coexist in the thicker Ge0.96Mn0.04 film (80nm). Their possible formation mechanism is attributed to the existence of ordered stacking faults. 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Both the mysterious Mn11Ge8 and the hexagonal Mn5Ge2 (a=0.72nm and c=1.3nm) clusters were confirmed to coexist in the thicker Ge0.96Mn0.04 film (80nm). Their possible formation mechanism is attributed to the existence of ordered stacking faults. The fact that no Mn-rich clusters found in thinner films (<=40nm) suggests that, for a given Mn concentration and growth/annealing condition, a critical thickness exists for the formation of Mn-rich clusters.</abstract><doi>10.1063/1.2884527</doi><oa>free_for_read</oa></addata></record> |
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title | Direct structural evidences of Mn11Ge8 and Mn5Ge2 clusters in Ge0.96Mn0.04 thin films |
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