Precise determination of absolute coverage of thin films by layer-resolved surface states

We report a technique to determine the coverage of metallic thin films by analyzing layer-resolved surface states with photoemission by using atomically flat Ag ∕ Au ( 111 ) thin films as a test system. We analyzed the surface state on Au(111) covered with Ag up to 4 ML with atomic resolution, and p...

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Bibliographic Details
Published in:Applied physics letters 2008-04, Vol.92 (16), p.163102-163102-3
Main Authors: Cheng, Cheng-Maw, Tsuei, Ku-Ding, Tsai, Chi-Ting, Luh, Dah-An
Format: Article
Language:English
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Summary:We report a technique to determine the coverage of metallic thin films by analyzing layer-resolved surface states with photoemission by using atomically flat Ag ∕ Au ( 111 ) thin films as a test system. We analyzed the surface state on Au(111) covered with Ag up to 4 ML with atomic resolution, and precisely determined the total Ag coverage of Ag ∕ Au ( 111 ) through a line-shape analysis. With precise measurements of the absolute coverage of thin films becoming possible, one can calibrate the tooling factor of evaporators with unprecedented accuracy.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2916820