An advanced magnetic reflectometer

A new experimental setup dedicated to the measurement of soft-x-ray magnetic absorption spectroscopy and soft-x-ray resonant magnetic reflectometry (soft-XRMR) is presented. XRMR is the combination of standard x-ray reflectometry with x-ray magnetic circular dichroism which provides chemical and mag...

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Bibliographic Details
Published in:Review of scientific instruments 2008-08, Vol.79 (8), p.083109-083109-6
Main Authors: Brück, Sebastian, Bauknecht, Steffen, Ludescher, Bernd, Goering, Eberhard, Schütz, Gisela
Format: Article
Language:English
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Summary:A new experimental setup dedicated to the measurement of soft-x-ray magnetic absorption spectroscopy and soft-x-ray resonant magnetic reflectometry (soft-XRMR) is presented. XRMR is the combination of standard x-ray reflectometry with x-ray magnetic circular dichroism which provides chemical and magnetic depth profiles of layered thin-film samples. This new diffractometer is optimized for a broad variety of sample systems. Therefore a balanced design focusing on high magnetic fields, low temperatures, and full freedom of rotation has been realized in UHV. First experimental results obtained on a NiCoO/Co bilayer sample are presented showing the potential of the setup.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.2970941