Loading…
Bipolar charge-carrier injection in semiconductor/insulator/conductor heterostructures: Self-consistent consideration
A self-consistent model of bipolar charge-carrier injection and transport processes in a semiconductor/insulator/conductor system is developed, which incorporates space-charge effects in the description of the injection process. The amount of charge carriers injected is strongly determined by the en...
Saved in:
Published in: | Journal of applied physics 2008-10, Vol.104 (7), p.073719-073719-13 |
---|---|
Main Authors: | , , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c319t-936b278c19ac309225c021bafafa573b95ba297dcf2bf2f65b1223139c0e7b5b3 |
---|---|
cites | cdi_FETCH-LOGICAL-c319t-936b278c19ac309225c021bafafa573b95ba297dcf2bf2f65b1223139c0e7b5b3 |
container_end_page | 073719-13 |
container_issue | 7 |
container_start_page | 073719 |
container_title | Journal of applied physics |
container_volume | 104 |
creator | Yampolskii, S. V. Genenko, Yu A. Melzer, C. Stegmaier, K. von Seggern, H. |
description | A self-consistent model of bipolar charge-carrier injection and transport processes in a semiconductor/insulator/conductor system is developed, which incorporates space-charge effects in the description of the injection process. The amount of charge carriers injected is strongly determined by the energy barrier emerging at the contact, but at the same time the electrostatic potential generated by the injected charge carriers modifies the height of this injection barrier itself. In our model, self-consistency is obtained by assuming continuity of the electric displacement and of the electrochemical potential all over the system. The constituents of the system are properly taken into account by means of their respective density of state distributions. The consequences resulting from our model are discussed on the basis of an indium tin oxide/organic semiconductor/conductor structure. The distributions of the charge carriers and the electric field through the electrodes and the organic layer are calculated. The recombination- and current-voltage characteristics are analyzed for different heights of injection barriers and varying values of the recombination rate and compared with the measured current-voltage dependences for an indium tin oxide/poly(phenylene vinylene)/Ca structure. The voltage dependences of the recombination efficiency for the different values of injection barriers and recombination rate reveal optimum conditions for the device performance. |
doi_str_mv | 10.1063/1.2990051 |
format | article |
fullrecord | <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_2990051</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>jap</sourcerecordid><originalsourceid>FETCH-LOGICAL-c319t-936b278c19ac309225c021bafafa573b95ba297dcf2bf2f65b1223139c0e7b5b3</originalsourceid><addsrcrecordid>eNp1kE9LAzEQxYMoWKsHv8FePaTNJKS78SBosSoUPKjnkKSJTdnulkn24Lc3_YM3mcO8GR7Dmx8ht8AmwGZiChOuFGMSzsgIWKNoLSU7JyPGONBG1eqSXKW0YQygEWpEhqe461uDlVsb_PbUGcTosYrdxrsc-66oKvltdH23GlzucRq7NLRmr_521dpnj33KWMYBfbqvPnwbaDGkmLLvcnWQK49mf_SaXATTJn9z6mPytXj-nL_S5fvL2_xxSZ0AlakSM8vrxoEyTjDFuXTlDWtCKVkLq6Q1XNUrF7gNPMykBc4FCOWYr620YkzujnddCZfQB73DuDX4o4HpPS8N-sSreB-O3uRiPqT833yCpo_Q9AGa-AW-43ao</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Bipolar charge-carrier injection in semiconductor/insulator/conductor heterostructures: Self-consistent consideration</title><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><creator>Yampolskii, S. V. ; Genenko, Yu A. ; Melzer, C. ; Stegmaier, K. ; von Seggern, H.</creator><creatorcontrib>Yampolskii, S. V. ; Genenko, Yu A. ; Melzer, C. ; Stegmaier, K. ; von Seggern, H.</creatorcontrib><description>A self-consistent model of bipolar charge-carrier injection and transport processes in a semiconductor/insulator/conductor system is developed, which incorporates space-charge effects in the description of the injection process. The amount of charge carriers injected is strongly determined by the energy barrier emerging at the contact, but at the same time the electrostatic potential generated by the injected charge carriers modifies the height of this injection barrier itself. In our model, self-consistency is obtained by assuming continuity of the electric displacement and of the electrochemical potential all over the system. The constituents of the system are properly taken into account by means of their respective density of state distributions. The consequences resulting from our model are discussed on the basis of an indium tin oxide/organic semiconductor/conductor structure. The distributions of the charge carriers and the electric field through the electrodes and the organic layer are calculated. The recombination- and current-voltage characteristics are analyzed for different heights of injection barriers and varying values of the recombination rate and compared with the measured current-voltage dependences for an indium tin oxide/poly(phenylene vinylene)/Ca structure. The voltage dependences of the recombination efficiency for the different values of injection barriers and recombination rate reveal optimum conditions for the device performance.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.2990051</identifier><identifier>CODEN: JAPIAU</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Journal of applied physics, 2008-10, Vol.104 (7), p.073719-073719-13</ispartof><rights>2008 American Institute of Physics</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c319t-936b278c19ac309225c021bafafa573b95ba297dcf2bf2f65b1223139c0e7b5b3</citedby><cites>FETCH-LOGICAL-c319t-936b278c19ac309225c021bafafa573b95ba297dcf2bf2f65b1223139c0e7b5b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids></links><search><creatorcontrib>Yampolskii, S. V.</creatorcontrib><creatorcontrib>Genenko, Yu A.</creatorcontrib><creatorcontrib>Melzer, C.</creatorcontrib><creatorcontrib>Stegmaier, K.</creatorcontrib><creatorcontrib>von Seggern, H.</creatorcontrib><title>Bipolar charge-carrier injection in semiconductor/insulator/conductor heterostructures: Self-consistent consideration</title><title>Journal of applied physics</title><description>A self-consistent model of bipolar charge-carrier injection and transport processes in a semiconductor/insulator/conductor system is developed, which incorporates space-charge effects in the description of the injection process. The amount of charge carriers injected is strongly determined by the energy barrier emerging at the contact, but at the same time the electrostatic potential generated by the injected charge carriers modifies the height of this injection barrier itself. In our model, self-consistency is obtained by assuming continuity of the electric displacement and of the electrochemical potential all over the system. The constituents of the system are properly taken into account by means of their respective density of state distributions. The consequences resulting from our model are discussed on the basis of an indium tin oxide/organic semiconductor/conductor structure. The distributions of the charge carriers and the electric field through the electrodes and the organic layer are calculated. The recombination- and current-voltage characteristics are analyzed for different heights of injection barriers and varying values of the recombination rate and compared with the measured current-voltage dependences for an indium tin oxide/poly(phenylene vinylene)/Ca structure. The voltage dependences of the recombination efficiency for the different values of injection barriers and recombination rate reveal optimum conditions for the device performance.</description><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNp1kE9LAzEQxYMoWKsHv8FePaTNJKS78SBosSoUPKjnkKSJTdnulkn24Lc3_YM3mcO8GR7Dmx8ht8AmwGZiChOuFGMSzsgIWKNoLSU7JyPGONBG1eqSXKW0YQygEWpEhqe461uDlVsb_PbUGcTosYrdxrsc-66oKvltdH23GlzucRq7NLRmr_521dpnj33KWMYBfbqvPnwbaDGkmLLvcnWQK49mf_SaXATTJn9z6mPytXj-nL_S5fvL2_xxSZ0AlakSM8vrxoEyTjDFuXTlDWtCKVkLq6Q1XNUrF7gNPMykBc4FCOWYr620YkzujnddCZfQB73DuDX4o4HpPS8N-sSreB-O3uRiPqT833yCpo_Q9AGa-AW-43ao</recordid><startdate>20081001</startdate><enddate>20081001</enddate><creator>Yampolskii, S. V.</creator><creator>Genenko, Yu A.</creator><creator>Melzer, C.</creator><creator>Stegmaier, K.</creator><creator>von Seggern, H.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20081001</creationdate><title>Bipolar charge-carrier injection in semiconductor/insulator/conductor heterostructures: Self-consistent consideration</title><author>Yampolskii, S. V. ; Genenko, Yu A. ; Melzer, C. ; Stegmaier, K. ; von Seggern, H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c319t-936b278c19ac309225c021bafafa573b95ba297dcf2bf2f65b1223139c0e7b5b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yampolskii, S. V.</creatorcontrib><creatorcontrib>Genenko, Yu A.</creatorcontrib><creatorcontrib>Melzer, C.</creatorcontrib><creatorcontrib>Stegmaier, K.</creatorcontrib><creatorcontrib>von Seggern, H.</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yampolskii, S. V.</au><au>Genenko, Yu A.</au><au>Melzer, C.</au><au>Stegmaier, K.</au><au>von Seggern, H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Bipolar charge-carrier injection in semiconductor/insulator/conductor heterostructures: Self-consistent consideration</atitle><jtitle>Journal of applied physics</jtitle><date>2008-10-01</date><risdate>2008</risdate><volume>104</volume><issue>7</issue><spage>073719</spage><epage>073719-13</epage><pages>073719-073719-13</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><coden>JAPIAU</coden><abstract>A self-consistent model of bipolar charge-carrier injection and transport processes in a semiconductor/insulator/conductor system is developed, which incorporates space-charge effects in the description of the injection process. The amount of charge carriers injected is strongly determined by the energy barrier emerging at the contact, but at the same time the electrostatic potential generated by the injected charge carriers modifies the height of this injection barrier itself. In our model, self-consistency is obtained by assuming continuity of the electric displacement and of the electrochemical potential all over the system. The constituents of the system are properly taken into account by means of their respective density of state distributions. The consequences resulting from our model are discussed on the basis of an indium tin oxide/organic semiconductor/conductor structure. The distributions of the charge carriers and the electric field through the electrodes and the organic layer are calculated. The recombination- and current-voltage characteristics are analyzed for different heights of injection barriers and varying values of the recombination rate and compared with the measured current-voltage dependences for an indium tin oxide/poly(phenylene vinylene)/Ca structure. The voltage dependences of the recombination efficiency for the different values of injection barriers and recombination rate reveal optimum conditions for the device performance.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.2990051</doi><oa>free_for_read</oa></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0021-8979 |
ispartof | Journal of applied physics, 2008-10, Vol.104 (7), p.073719-073719-13 |
issn | 0021-8979 1089-7550 |
language | eng |
recordid | cdi_crossref_primary_10_1063_1_2990051 |
source | American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list) |
title | Bipolar charge-carrier injection in semiconductor/insulator/conductor heterostructures: Self-consistent consideration |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-21T14%3A13%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Bipolar%20charge-carrier%20injection%20in%20semiconductor/insulator/conductor%20heterostructures:%20Self-consistent%20consideration&rft.jtitle=Journal%20of%20applied%20physics&rft.au=Yampolskii,%20S.%20V.&rft.date=2008-10-01&rft.volume=104&rft.issue=7&rft.spage=073719&rft.epage=073719-13&rft.pages=073719-073719-13&rft.issn=0021-8979&rft.eissn=1089-7550&rft.coden=JAPIAU&rft_id=info:doi/10.1063/1.2990051&rft_dat=%3Cscitation_cross%3Ejap%3C/scitation_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c319t-936b278c19ac309225c021bafafa573b95ba297dcf2bf2f65b1223139c0e7b5b3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |