Thickness dependent electronic structure of La0.6Sr0.4MnO3 layer in SrTiO3/La0.6Sr0.4MnO3/SrTiO3 heterostructures studied by hard x-ray photoemission spectroscopy

The authors have investigated changes in the electronic structures of digitally controlled La0.6Sr0.4MnO3 (LSMO) layers sandwiched between SrTiO3 as a function of LSMO layer thickness in terms of hard x-ray photoemission spectroscopy (HX-PES). The HX-PES spectra show the evolution of Mn 3d derived s...

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Bibliographic Details
Published in:Applied physics letters 2009-02, Vol.94 (7)
Main Authors: Yoshimatsu, K., Horiba, K., Kumigashira, H., Ikenaga, E., Oshima, M.
Format: Article
Language:English
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Summary:The authors have investigated changes in the electronic structures of digitally controlled La0.6Sr0.4MnO3 (LSMO) layers sandwiched between SrTiO3 as a function of LSMO layer thickness in terms of hard x-ray photoemission spectroscopy (HX-PES). The HX-PES spectra show the evolution of Mn 3d derived states near the Fermi level and the occurrence of metal-insulator transition at 8 ML. The detailed analysis for the thickness dependent HX-PES spectra reveals the existence of the less conducting and nonmagnetic transition layer with a film thickness of about 4 ML in the interface region owing to significant interaction through the interface.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.3081016