Accuracy assessment of strain mapping from Z-contrast images of strained nanostructures

Geometric phase and peak pairs strain mapping techniques have been applied to high angular annular dark field scanning transmission electron microscopy (HAADF-STEM) simulated images of an InAs/InP strained nanowire at different sample thicknesses. Strain values determined from HAADF-STEM images have...

Full description

Saved in:
Bibliographic Details
Published in:Applied physics letters 2009-10, Vol.95 (14)
Main Authors: Guerrero, E., Galindo, P. L., Yáñez, A., Pizarro, J., Guerrero-Lebrero, M. P., Molina, S. I.
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Geometric phase and peak pairs strain mapping techniques have been applied to high angular annular dark field scanning transmission electron microscopy (HAADF-STEM) simulated images of an InAs/InP strained nanowire at different sample thicknesses. Strain values determined from HAADF-STEM images have been compared to theoretical values obtained by solving the elastic theory equation by finite element analysis, in order to analyze and assess both techniques in terms of accuracy of the predictions.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.3243990