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Magnetic and structural properties of Rh substituted Co-Cr alloy films with perpendicular magnetic anisotropy

RF sputtered Co0.78−xCr0.22Rhx (where x is 0–0.06) alloy films for high density perpendicular recording were studied. First, Co-M (M = Cr, Ti, V, Mo, Pd, and Rh) alloy films were studied. They exhibit hcp crystallization and have a high orientation of the c-axis normal to the film plane. However, th...

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Bibliographic Details
Published in:Journal of applied physics 1981-01, Vol.52 (3), p.2453-2455
Main Authors: Kobayashi, K., Ishida, G.
Format: Article
Language:English
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Summary:RF sputtered Co0.78−xCr0.22Rhx (where x is 0–0.06) alloy films for high density perpendicular recording were studied. First, Co-M (M = Cr, Ti, V, Mo, Pd, and Rh) alloy films were studied. They exhibit hcp crystallization and have a high orientation of the c-axis normal to the film plane. However, they have a smaller coercive force (less than 300 Oe), and with the exception of Co-Cr, they do not have a columnar structure or satisfy the relation Hk ≳4πMs. Next, Co-Cr-Rh alloy films were studied. They also exhibit hcp crystallization and their structure is columnar. They show perpendicular magnetic anisotropy similar to that of Co-Cr, and in particular, a higher c-axis orientation was obtained. The ΔΘ50, half the width of a rocking curve of a (002) peak, is about 20–40% smaller than that of Co-Cr. By measuring the recording characteristics of Co-Cr-Rh disks (on an anodized aluminum substrate), a maximum recording density of 23,000FRPI was obtained.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.328964