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HTSC cuprate films doped with nanoparticles and their electrodynamics, determined by Abrikosov vortices

This paper presents the results of a comprehensive study of the relationship of the structural and electrodynamic characteristics of quasi-single-crystal films of the HTSC cuprate Y Ba 2 Cu 3 O 7 − δ (YBCO) with various concentrations (several mass percent) of nanosize inclusions of the perovskiteli...

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Bibliographic Details
Published in:Low temperature physics (Woodbury, N.Y.) N.Y.), 2010-01, Vol.36 (1), p.59-70
Main Authors: Flis, V. S., Kalenyuk, A. A., Kasatkin, A. L., Moskalyuk, V. O., Rebikov, A. I., Svechnikov, V. L., Tret’yachenko, K. G., Pan, V. M.
Format: Article
Language:English
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Summary:This paper presents the results of a comprehensive study of the relationship of the structural and electrodynamic characteristics of quasi-single-crystal films of the HTSC cuprate Y Ba 2 Cu 3 O 7 − δ (YBCO) with various concentrations (several mass percent) of nanosize inclusions of the perovskitelike phase of Ba Zr O 3 (BZO). High-resolution electron microscopy is used to investigate the nanostructure of the fabricated films and to determine the main types of defects that cause strong pinning of Abrikosov vortices and, accordingly, large critical current densities. The results of theoretically modelling the genesis of the defect nanostructure that appears in such films and its influence on the critical current are presented. The magnetic and transport properties of HTSC films made from YBCO(BZO) have been experimentally studied. The temperature, magnetic-field, and magnetic-orientation dependences of the critical current density of the test films are found. The results of an experimental investigation of the high-frequency properties of YBZO(BZO) films—the surface microwave impedance of the films in the linear and nonlinear regimes—are also given. The experimental results are discussed, and the influence of the nanostructure of the impurity phase on the electrodynamic characteristics of the HTSC films is analyzed.
ISSN:1063-777X
1090-6517
DOI:10.1063/1.3292938