Magnetization dynamics of micron size thin Permalloy films

The magnetic properties of thin films of NiFe Permalloy of micron dimensions have been investigated both in the presence and absence of a titanium underlayer on silicon oxidized substrates. For those samples possessing a low aspect ratio, the domain walls remain fixed almost throughout the entire ra...

Full description

Saved in:
Bibliographic Details
Published in:Journal of applied physics 1984-01, Vol.55 (6), p.2232-2234
Main Authors: Ozimek, E. J., Paul, D. I.
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The magnetic properties of thin films of NiFe Permalloy of micron dimensions have been investigated both in the presence and absence of a titanium underlayer on silicon oxidized substrates. For those samples possessing a low aspect ratio, the domain walls remain fixed almost throughout the entire range of our external field capacity of 40 Oe—this stability increasing with increasing film thickness. Magnetic moment reversal appears to occur by magnetic moment rotation within the domains rather than by domain wall motion. As the sample length increases in size, we see edge domains at either end but a lack of domain structure through the sample length. The presence of the titanium underlayer increases the stability and produces a marked asymmetry in our domain wall structure as we cycled through the B-H hysteresis loop. All samples displayed a marked increase in the coercive force compared to Permalloy thin films of large size planar dimensions.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.333620