Observation of magnetic forces by the atomic force microscope

We present a new way to observe the surface domain distribution of a magnetic sample at a submicrometer scale. This magnetic microscopy is based on the idea of measuring magnetic forces with the recently developed atomic force microscope (AFM). We study the magnetic forces involved in the interactio...

Full description

Saved in:
Bibliographic Details
Published in:Journal of applied physics 1987-11, Vol.62 (10), p.4293-4295
Main Authors: SAENZ, J. J, GARCIA, N, GRUTTER, P, MEYER, E, HEINZELMANN, H, WIESENDANGER, R, ROSENTHALER, L, HIDBER, H. R, GUNTHERODT, H.-J
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Cross-disciplinary physics: materials science
rheology
Domain effects, magnetization curves, and hysteresis
Exact sciences and technology
Magnetic properties and materials
Materials science
Metals, semimetals and alloys
Other topics in magnetic properties and materials
Physics
Specific materials
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We present a new way to observe the surface domain distribution of a magnetic sample at a submicrometer scale. This magnetic microscopy is based on the idea of measuring magnetic forces with the recently developed atomic force microscope (AFM). We study the magnetic forces involved in the interaction between a single-domain microtip and the sample surface magnetic domains. The influence of the experimental conditions on the performance of the AFM as a magnetic profiling device is also discussed. Preliminary experimental results are reported.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.339105