An abnormal dielectric relaxation phenomenon observed in PbZr0.38Ti0.62O3 multilayers

We report an unusual dielectric relaxation phenomenon associated with dipolar defect complexes Ti3+-(Vo2−)•• observed in the PbZr0.38Ti0.62O3 multilayers. The dielectric loss aroused by the polarization of defect dipoles varies with time under ac electric fields, and its change can be controlled by...

Full description

Saved in:
Bibliographic Details
Published in:Journal of applied physics 2010-05, Vol.107 (9)
Main Authors: Hu, G. J., Zhang, T., Bu, H. J., Sun, J. L., Chu, J. H., Dai, N., Zhu, D. M., Wu, Y. Zh
Format: Article
Language:English
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We report an unusual dielectric relaxation phenomenon associated with dipolar defect complexes Ti3+-(Vo2−)•• observed in the PbZr0.38Ti0.62O3 multilayers. The dielectric loss aroused by the polarization of defect dipoles varies with time under ac electric fields, and its change can be controlled by an applied dc bias. This abnormally dynamic behavior of dielectric loss can be interpreted by the formation and dissociation of dipolar defect pairs Ti3+-(Vo2−)•• by injection of charged carriers. These investigations may be beneficial to getting further insight into the defect dynamics and the mechanism of ferroelectric polarization fatigue and restoration in ferroelectric materials.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.3415552