recent progress in studies of a-CSiSn:H alloys

The a-CSiSn alloy produced by rf magnetron sputtering in SiH4, CH4, and Ar atmosphere was studied as a function of the substrate temperature. The composition of the films was determined by elastic recoil detection analysis and by Rutherford backscattering measurements, and the density was then deduc...

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Bibliographic Details
Published in:Journal of applied physics 1988-07, Vol.64 (2), p.721-726
Main Authors: DEMICHELIS, F, KANIADAKIS, G, TAGLIAFERRO, A, TRESSO, E, RAVA, P, DELLA MEA, G
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
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Summary:The a-CSiSn alloy produced by rf magnetron sputtering in SiH4, CH4, and Ar atmosphere was studied as a function of the substrate temperature. The composition of the films was determined by elastic recoil detection analysis and by Rutherford backscattering measurements, and the density was then deduced. Results of a study of optical and electrical properties and of the bonding and structure of the films indicate that with the increase of the substrate temperature, the density and the imaginary part of the dielectric constant increases, the optical gap decreases, and the dark conductivity presents a different conduction mechanism depending on the substrate temperature. A correlation between the results obtained from nuclear measurements and IR spectroscopy is presented.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.341968