Substrate influence on the optical and structural properties of pulsed laser deposited BiFeO3 epitaxial films

Epitaxial BiFeO3 films pulsed laser deposited on SrTiO3, Nb:doped SrTiO3, and DyScO3 were studied using variable angle spectroscopic ellipsometry, vacuum ultraviolet ellipsometry, micro-Raman spectroscopy, and x-ray diffraction. The energy band gap of the film deposited on DyScO3 is 2.75 eV, while t...

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Bibliographic Details
Published in:Journal of applied physics 2010-06, Vol.107 (12)
Main Authors: Himcinschi, C., Vrejoiu, I., Friedrich, M., Nikulina, E., Ding, L., Cobet, C., Esser, N., Alexe, M., Rafaja, D., Zahn, D. R. T.
Format: Article
Language:English
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Summary:Epitaxial BiFeO3 films pulsed laser deposited on SrTiO3, Nb:doped SrTiO3, and DyScO3 were studied using variable angle spectroscopic ellipsometry, vacuum ultraviolet ellipsometry, micro-Raman spectroscopy, and x-ray diffraction. The energy band gap of the film deposited on DyScO3 is 2.75 eV, while the one for the film deposited on Nb:doped SrTiO3 is larger by 50 meV. The blueshift in the dielectric function of the BiFeO3 films deposited on Nb:doped SrTiO3 compared to the films deposited on DyScO3, indicates a larger compressive strain in the films deposited on Nb:doped SrTiO3. This is confirmed by Raman spectroscopy and by high resolution x-ray diffraction investigations.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.3437059