Three-dimensional ferroelectric domain imaging of epitaxial BiFeO3 thin films using angle-resolved piezoresponse force microscopy

Here we introduce angle-resolved piezoresponse force microscopy (AR-PFM), whereby the sample is rotated by 30° increments around the surface normal vector and the in-plane PFM phase signals are collected at each angle. We obtained the AR-PFM images of BaTiO3 single crystal and cube-on-cube epitaxial...

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Bibliographic Details
Published in:Applied physics letters 2010-09, Vol.97 (11)
Main Authors: Park, Moonkyu, Hong, Seungbum, Klug, Jeffrey A., Bedzyk, Michael J., Auciello, Orlando, No, Kwangsoo, Petford-Long, Amanda
Format: Article
Language:English
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Summary:Here we introduce angle-resolved piezoresponse force microscopy (AR-PFM), whereby the sample is rotated by 30° increments around the surface normal vector and the in-plane PFM phase signals are collected at each angle. We obtained the AR-PFM images of BaTiO3 single crystal and cube-on-cube epitaxial (001) BiFeO3 (BFO) thin film on SrRuO3/SrTiO3 substrate, and confirmed that the AR-PFM provides more unambiguous information on the in-plane polarization directions than the conventional PFM method. Moreover, we found eight additional in-plane polarization variants in epitaxial BFO thin films, which are formed to mitigate highly unstable charged domain boundaries.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.3487933