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Image contrast in near-field optics

The resolution of optical microscopy can be extended beyond the diffraction limit by placing a source or detector of visible light having dimensions much smaller than the wavelength, λ, in the near-field of the sample (

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Bibliographic Details
Published in:Journal of applied physics 1992-05, Vol.71 (10), p.4659-4663
Main Authors: TRAUTMAN, J. K, BETZIG, E, WEINER, J. S, DIGIOVANNI, D. J, HARRIS, T. D, HELLMAN, F, GYORGY, E. M
Format: Article
Language:English
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Description
Summary:The resolution of optical microscopy can be extended beyond the diffraction limit by placing a source or detector of visible light having dimensions much smaller than the wavelength, λ, in the near-field of the sample (
ISSN:0021-8979
1089-7550
DOI:10.1063/1.350655