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Quantitative determination of the recombining activities of 60° and screw dislocations in float zone and Czochralski-grown silicon
We have characterized quantitatively the recombining activities of 60° and screw dislocations by their recombination velocities. This parameter was derived from the diffusion length determined by using the surface photovoltage method. Dislocations were introduced in initially perfect float zone and...
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Published in: | Journal of applied physics 1992-02, Vol.71 (3), p.1284-1289 |
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container_end_page | 1289 |
container_issue | 3 |
container_start_page | 1284 |
container_title | Journal of applied physics |
container_volume | 71 |
creator | MARIANI, J. L PICHAUD, B MINARI, F MARTINUZZI, S |
description | We have characterized quantitatively the recombining activities of 60° and screw dislocations by their recombination velocities. This parameter was derived from the diffusion length determined by using the surface photovoltage method. Dislocations were introduced in initially perfect float zone and Czochralski-grown crystals, at different temperatures. The results show that 60° dislocations are much more active than screws, and that the activity increases markedly with oxygen content of the material and with the temperature at which dislocations were introduced. |
doi_str_mv | 10.1063/1.351245 |
format | article |
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The results show that 60° dislocations are much more active than screws, and that the activity increases markedly with oxygen content of the material and with the temperature at which dislocations were introduced.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.351245</identifier><identifier>CODEN: JAPIAU</identifier><language>eng</language><publisher>Woodbury, NY: American Institute of Physics</publisher><subject>Charge carriers: generation, recombination, lifetime, and trapping ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Conductivity phenomena in semiconductors and insulators ; Electronic transport in condensed matter ; Exact sciences and technology ; Physics</subject><ispartof>Journal of applied physics, 1992-02, Vol.71 (3), p.1284-1289</ispartof><rights>1992 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c169t-7af752cc44aba40b27d2aef5e05ba31c0adb2786dfc2c6de2f996dd46779a0c83</citedby><cites>FETCH-LOGICAL-c169t-7af752cc44aba40b27d2aef5e05ba31c0adb2786dfc2c6de2f996dd46779a0c83</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=5109841$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>MARIANI, J. 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The results show that 60° dislocations are much more active than screws, and that the activity increases markedly with oxygen content of the material and with the temperature at which dislocations were introduced.</description><subject>Charge carriers: generation, recombination, lifetime, and trapping</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Conductivity phenomena in semiconductors and insulators</subject><subject>Electronic transport in condensed matter</subject><subject>Exact sciences and technology</subject><subject>Physics</subject><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1992</creationdate><recordtype>article</recordtype><recordid>eNo9kM1OwzAQhC0EEqUg8Qg-cOCSYidxEh9RxZ9UCSHBOdqs7daQ2pVtqOiVF-IZeDLSFnEa7cy3cxhCzjmbcFYVV3xSCJ6X4oCMOGtkVgvBDsmIsZxnjazlMTmJ8ZUxzptCjsjX0zu4ZBMk-6Gp0kmHpXXD5R31hqaFpkGjX3bWWTengANnk9Vxm1bs55uCUzRi0GuqbOw97n4jtY6a3kOiG-_0DppuPC4C9PHNZvPg145G21v07pQcmcHWZ386Ji-3N8_T-2z2ePcwvZ5lyCuZshpMLXLEsoQOStbltcpBG6GZ6KDgyEANXlMpgzlWSudGykqpsqprCQybYkwu970YfIxBm3YV7BLCZ8tZux2v5e1-vAG92KMriAi9CeDQxn9ecCabkhe_EDJyVg</recordid><startdate>19920201</startdate><enddate>19920201</enddate><creator>MARIANI, J. 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L ; PICHAUD, B ; MINARI, F ; MARTINUZZI, S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c169t-7af752cc44aba40b27d2aef5e05ba31c0adb2786dfc2c6de2f996dd46779a0c83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1992</creationdate><topic>Charge carriers: generation, recombination, lifetime, and trapping</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Conductivity phenomena in semiconductors and insulators</topic><topic>Electronic transport in condensed matter</topic><topic>Exact sciences and technology</topic><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>MARIANI, J. L</creatorcontrib><creatorcontrib>PICHAUD, B</creatorcontrib><creatorcontrib>MINARI, F</creatorcontrib><creatorcontrib>MARTINUZZI, S</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>MARIANI, J. L</au><au>PICHAUD, B</au><au>MINARI, F</au><au>MARTINUZZI, S</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Quantitative determination of the recombining activities of 60° and screw dislocations in float zone and Czochralski-grown silicon</atitle><jtitle>Journal of applied physics</jtitle><date>1992-02-01</date><risdate>1992</risdate><volume>71</volume><issue>3</issue><spage>1284</spage><epage>1289</epage><pages>1284-1289</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><coden>JAPIAU</coden><abstract>We have characterized quantitatively the recombining activities of 60° and screw dislocations by their recombination velocities. This parameter was derived from the diffusion length determined by using the surface photovoltage method. Dislocations were introduced in initially perfect float zone and Czochralski-grown crystals, at different temperatures. The results show that 60° dislocations are much more active than screws, and that the activity increases markedly with oxygen content of the material and with the temperature at which dislocations were introduced.</abstract><cop>Woodbury, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.351245</doi><tpages>6</tpages></addata></record> |
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subjects | Charge carriers: generation, recombination, lifetime, and trapping Condensed matter: electronic structure, electrical, magnetic, and optical properties Conductivity phenomena in semiconductors and insulators Electronic transport in condensed matter Exact sciences and technology Physics |
title | Quantitative determination of the recombining activities of 60° and screw dislocations in float zone and Czochralski-grown silicon |
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