Heavy ion beam pumped amplified spontaneous emission on the 172 nm xenon excimer transition

• Published in: Journal of applied physics 1993-11, Vol.74 (10), p.5960-5963
• Main Authors: BUSCH, B, ULRICH, A, KRÖTZ, W, RIBITZKI, G, WIESER, J, WINKLER, M
• Format: Article
• Language: English
• Subjects: Absolute and relative line and band intensities; Atomic and molecular collision processes and interactions; Atomic and molecular physics; Exact sciences and technology; Fundamental areas of phenomenology (including applications); Gas lasers including excimer and metal-vapor lasers; Intensities and shapes of molecular spectral lines and bands; Lasers; Molecular properties and interactions with photons; Optics; Other topics in atomic and molecular collision processes and interactions; Physics
• ISSN: 0021-8979; 1089-7550
• DOI: 10.1063/1.355208

Amplified spontaneous emission on the second xenon excimer continuum at 172 nm wavelength was observed in dense gas evaporated from a solid xenon surface and pumped by heavy ions. A pulsed 3.78 MeV Kr+ beam from a radio-frequency quadrupole accelerator was used for the experiment. A series of 800 μJ particle pulses each 10 ns long was focused to a small, elliptical beam spot leading to a pump power density of the order of 1 GW/g. Optical gain in the target was deduced from the angular distribution of light emitted along the target axis, and from a variation of optical intensity with gain length. A maximum gain of 26%/cm was determined using a model calculation which reproduced the experimental data.