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Low-temperature acoustic properties of nanostructured zirconium obtained by intensive plastic deformation
The temperature dependences of the logarithmic decrement and dynamic Young’s modulus of polycrystalline coarse-grained and nanostructured Zr are studied at temperatures of 2.5 – 340 K . A nanostructured state of samples with grain sizes on the order of 100 nm was produced by intensive plastic deform...
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Published in: | Low temperature physics (Woodbury, N.Y.) N.Y.), 2011-02, Vol.37 (2), p.169-176 |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The temperature dependences of the logarithmic decrement and dynamic Young’s modulus of polycrystalline coarse-grained and nanostructured Zr are studied at temperatures of
2.5
–
340
K
. A nanostructured state of samples with grain sizes on the order of
100
nm
was produced by intensive plastic deformation (IPD). The measurements were made using a two-component vibrator technique at frequencies of
73
–
350
kHz
. A relaxation peak in the internal friction near
250
K
was discovered in the coarse-grained, annealed Zr which is retained after IPD, but its height increases by roughly a factor of 10 and the localization temperature shifts to lower values. In addition, after IPD a new internal friction peak shows up at moderately low temperatures near
80
K
. The activation parameters for the observed peaks are estimated and it is shown that they arise from different thermally activated dislocation processes: interactions of dislocations with impurities and kink pair formation in dislocations. It was found that IPD is accompanied by a significant (1–8%) reduction in the Young’s modulus because of quasistatic and dynamic dislocation effects. A glass-like anomaly appears in the temperature dependence of the Young’s modulus of nanostructured Zr at
T
<
20
K
which may be determined by tunnelling and thermally activated relaxation of quasilocal excitations. |
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ISSN: | 1063-777X 1090-6517 |
DOI: | 10.1063/1.3556667 |