Optical strength of Si–Si x Ge1− x direct-band-gap superlattices

Optical strength is evaluated for various types of Si–SixGe1−x direct-band-gap superlattices. A method for the evaluation is developed that is compatible with a k⋅p method for indirect-band-gap constituent materials, which is more rigorous than the envelope-function approach. The optical matrix elem...

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Bibliographic Details
Published in:Journal of applied physics 1994-09, Vol.76 (6), p.3754-3757
Main Authors: Cole, J. Vernon, Lee, Hong H.
Format: Article
Language:English
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Summary:Optical strength is evaluated for various types of Si–SixGe1−x direct-band-gap superlattices. A method for the evaluation is developed that is compatible with a k⋅p method for indirect-band-gap constituent materials, which is more rigorous than the envelope-function approach. The optical matrix elements based on the more rigorous method are found to be an order of magnitude greater than the values previously reported based on the envelope-function approach.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.357406