Loading…
Nanoscale deposition from a metal-covered scanning tunneling microscope tip
A fabrication method using a metal-covered scanning tunneling microscope tip has been developed to provide a nanoscale deposition method with various metal species. Nanoscale deposition has been carried out on highly oriented pyrolytic graphite with a core tungsten tip, a gold-covered tungsten tip,...
Saved in:
Published in: | Journal of applied physics 1996-03, Vol.79 (6), p.3348-3350 |
---|---|
Main Authors: | , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c225t-2620a4185a59a0ccbb5a487af918dfb8707c31a5448c62ba70af074a2f792f63 |
---|---|
cites | cdi_FETCH-LOGICAL-c225t-2620a4185a59a0ccbb5a487af918dfb8707c31a5448c62ba70af074a2f792f63 |
container_end_page | 3350 |
container_issue | 6 |
container_start_page | 3348 |
container_title | Journal of applied physics |
container_volume | 79 |
creator | Andoh, Hiroki Yokoi, Naoki Takai, Mikio |
description | A fabrication method using a metal-covered scanning tunneling microscope tip has been developed to provide a nanoscale deposition method with various metal species. Nanoscale deposition has been carried out on highly oriented pyrolytic graphite with a core tungsten tip, a gold-covered tungsten tip, and an aluminum-covered tungsten tip, by applying tip positive voltage pulses. The threshold voltage, above which deposition occurred, showed a linear dependence on the tip-sample separation and differed for tip material. This suggests that the fabrication mechanism is field-induced and the deposition takes place by the transfer of tip material to the sample. |
doi_str_mv | 10.1063/1.361238 |
format | article |
fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_361238</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_361238</sourcerecordid><originalsourceid>FETCH-LOGICAL-c225t-2620a4185a59a0ccbb5a487af918dfb8707c31a5448c62ba70af074a2f792f63</originalsourceid><addsrcrecordid>eNotkEtLxDAUhYMoWEfBn5Clm4z3Jk2TLGXwhYNuZl9u00QqbVqaKvjvnTKuzlmcB3yM3SJsESp1j1tVoVT2jBUI1gmjNZyzAkCisM64S3aV8xcAolWuYG_vlMbsqQ-8DdOYu6UbE4_zOHDiQ1ioF378CXNo-TGVUpc--fKdUuhXN3R-PrbHKfClm67ZRaQ-h5t_3bDD0-Nh9yL2H8-vu4e98FLqRchKApVoNWlH4H3TaCqtoejQtrGxBoxXSLosra9kQwYogilJRuNkrNSG3Z1m1-88h1hPczfQ_Fsj1CuDGusTA_UHgBxOzA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Nanoscale deposition from a metal-covered scanning tunneling microscope tip</title><source>AIP Digital Archive</source><creator>Andoh, Hiroki ; Yokoi, Naoki ; Takai, Mikio</creator><creatorcontrib>Andoh, Hiroki ; Yokoi, Naoki ; Takai, Mikio</creatorcontrib><description>A fabrication method using a metal-covered scanning tunneling microscope tip has been developed to provide a nanoscale deposition method with various metal species. Nanoscale deposition has been carried out on highly oriented pyrolytic graphite with a core tungsten tip, a gold-covered tungsten tip, and an aluminum-covered tungsten tip, by applying tip positive voltage pulses. The threshold voltage, above which deposition occurred, showed a linear dependence on the tip-sample separation and differed for tip material. This suggests that the fabrication mechanism is field-induced and the deposition takes place by the transfer of tip material to the sample.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.361238</identifier><language>eng</language><ispartof>Journal of applied physics, 1996-03, Vol.79 (6), p.3348-3350</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c225t-2620a4185a59a0ccbb5a487af918dfb8707c31a5448c62ba70af074a2f792f63</citedby><cites>FETCH-LOGICAL-c225t-2620a4185a59a0ccbb5a487af918dfb8707c31a5448c62ba70af074a2f792f63</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids></links><search><creatorcontrib>Andoh, Hiroki</creatorcontrib><creatorcontrib>Yokoi, Naoki</creatorcontrib><creatorcontrib>Takai, Mikio</creatorcontrib><title>Nanoscale deposition from a metal-covered scanning tunneling microscope tip</title><title>Journal of applied physics</title><description>A fabrication method using a metal-covered scanning tunneling microscope tip has been developed to provide a nanoscale deposition method with various metal species. Nanoscale deposition has been carried out on highly oriented pyrolytic graphite with a core tungsten tip, a gold-covered tungsten tip, and an aluminum-covered tungsten tip, by applying tip positive voltage pulses. The threshold voltage, above which deposition occurred, showed a linear dependence on the tip-sample separation and differed for tip material. This suggests that the fabrication mechanism is field-induced and the deposition takes place by the transfer of tip material to the sample.</description><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1996</creationdate><recordtype>article</recordtype><recordid>eNotkEtLxDAUhYMoWEfBn5Clm4z3Jk2TLGXwhYNuZl9u00QqbVqaKvjvnTKuzlmcB3yM3SJsESp1j1tVoVT2jBUI1gmjNZyzAkCisM64S3aV8xcAolWuYG_vlMbsqQ-8DdOYu6UbE4_zOHDiQ1ioF378CXNo-TGVUpc--fKdUuhXN3R-PrbHKfClm67ZRaQ-h5t_3bDD0-Nh9yL2H8-vu4e98FLqRchKApVoNWlH4H3TaCqtoejQtrGxBoxXSLosra9kQwYogilJRuNkrNSG3Z1m1-88h1hPczfQ_Fsj1CuDGusTA_UHgBxOzA</recordid><startdate>19960315</startdate><enddate>19960315</enddate><creator>Andoh, Hiroki</creator><creator>Yokoi, Naoki</creator><creator>Takai, Mikio</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19960315</creationdate><title>Nanoscale deposition from a metal-covered scanning tunneling microscope tip</title><author>Andoh, Hiroki ; Yokoi, Naoki ; Takai, Mikio</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c225t-2620a4185a59a0ccbb5a487af918dfb8707c31a5448c62ba70af074a2f792f63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1996</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Andoh, Hiroki</creatorcontrib><creatorcontrib>Yokoi, Naoki</creatorcontrib><creatorcontrib>Takai, Mikio</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Andoh, Hiroki</au><au>Yokoi, Naoki</au><au>Takai, Mikio</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Nanoscale deposition from a metal-covered scanning tunneling microscope tip</atitle><jtitle>Journal of applied physics</jtitle><date>1996-03-15</date><risdate>1996</risdate><volume>79</volume><issue>6</issue><spage>3348</spage><epage>3350</epage><pages>3348-3350</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><abstract>A fabrication method using a metal-covered scanning tunneling microscope tip has been developed to provide a nanoscale deposition method with various metal species. Nanoscale deposition has been carried out on highly oriented pyrolytic graphite with a core tungsten tip, a gold-covered tungsten tip, and an aluminum-covered tungsten tip, by applying tip positive voltage pulses. The threshold voltage, above which deposition occurred, showed a linear dependence on the tip-sample separation and differed for tip material. This suggests that the fabrication mechanism is field-induced and the deposition takes place by the transfer of tip material to the sample.</abstract><doi>10.1063/1.361238</doi><tpages>3</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0021-8979 |
ispartof | Journal of applied physics, 1996-03, Vol.79 (6), p.3348-3350 |
issn | 0021-8979 1089-7550 |
language | eng |
recordid | cdi_crossref_primary_10_1063_1_361238 |
source | AIP Digital Archive |
title | Nanoscale deposition from a metal-covered scanning tunneling microscope tip |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T09%3A22%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Nanoscale%20deposition%20from%20a%20metal-covered%20scanning%20tunneling%20microscope%20tip&rft.jtitle=Journal%20of%20applied%20physics&rft.au=Andoh,%20Hiroki&rft.date=1996-03-15&rft.volume=79&rft.issue=6&rft.spage=3348&rft.epage=3350&rft.pages=3348-3350&rft.issn=0021-8979&rft.eissn=1089-7550&rft_id=info:doi/10.1063/1.361238&rft_dat=%3Ccrossref%3E10_1063_1_361238%3C/crossref%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c225t-2620a4185a59a0ccbb5a487af918dfb8707c31a5448c62ba70af074a2f792f63%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |