Proximity effect in electron-doped cuprate Josephson junctions

We study the proximity effect in Josephson junctions made of electron-doped cuprates Pr 2- x Ce x CuO 4 (PCCO). With superconducting electrodes at a fixed doping x =0.15, we explore the variation of the Josephson coupling with the doping and the thickness of the barrier. We observe Josephson couplin...

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Bibliographic Details
Published in:Applied physics letters 2011-07, Vol.99 (3), p.032511-032511-3
Main Authors: Charpentier, S., Roberge, G., Godin-Proulx, S., Fournier, P.
Format: Article
Language:English
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Summary:We study the proximity effect in Josephson junctions made of electron-doped cuprates Pr 2- x Ce x CuO 4 (PCCO). With superconducting electrodes at a fixed doping x =0.15, we explore the variation of the Josephson coupling with the doping and the thickness of the barrier. We observe Josephson coupling for any type of barrier: antiferromagnetic (AF) metal, AF insulator, or paramagnetic metal. For an x =0.05 barrier, we can estimate the normal coherence length, ξ n =12±3 nm. Comparing this value with the theoretical prediction, ξ n , max =4.5 nm, we conclude that the proximity effect through a barrier of PCCO x =0.05 is stronger than expected.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.3613999