Erratum: “Measurement of SiO2/InZnGaO4 heterojunction band offsets by x-ray photoelectron spectroscopy” [Appl. Phys. Lett. 98 , 242110 (2011)]

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Bibliographic Details
Published in:Applied physics letters 2011-08, Vol.99 (5)
Main Authors: Douglas, E. A., Scheurmann, A., Davies, R. P., Gila, B. P., Cho, Hyun, Craciun, V., Lambers, E. S., Pearton, S. J., Ren, F.
Format: Article
Language:English
Online Access:Get full text
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ISSN:0003-6951
1077-3118
DOI:10.1063/1.3617417