Viscosity of Hg0.84Zn0.16Te pseudobinary melt

An oscillating-cup viscometer was developed to measure viscosity of molten HgZnTe ternary semiconductor alloys. Data were collected for the pseudobinary Hg0.84Zn0.16Te melt between 770 and 850 °C. The kinematic viscosity was found to vary from approximately 1.1 to 1.4×10−3 cm2 s−1. A slow relaxation...

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Bibliographic Details
Published in:Journal of applied physics 1996-06, Vol.79 (12), p.9080-9083
Main Authors: Mazuruk, K., Su, Ching-Hua, Sha, Yi-Gao, Lehoczky, S. L.
Format: Article
Language:English
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Summary:An oscillating-cup viscometer was developed to measure viscosity of molten HgZnTe ternary semiconductor alloys. Data were collected for the pseudobinary Hg0.84Zn0.16Te melt between 770 and 850 °C. The kinematic viscosity was found to vary from approximately 1.1 to 1.4×10−3 cm2 s−1. A slow relaxation phenomena was also observed for temperatures from the melting point of 770 to ∼800 °C. Possible mechanisms for this effect are discussed.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.362580