Atomic level stress and light emission of Ce activated SrS thin films

We find that the Ce3+ ion in polycrystalline sputtered SrS:Ce thin films resides in a distorted octahedral environment, as opposed to the cubic host environment. Using electron paramagnetic resonance and x-ray diffraction analysis, we show that the degree of axial distortion is related to the prefer...

Full description

Saved in:
Bibliographic Details
Published in:Journal of applied physics 1997-08, Vol.82 (4), p.1812-1814
Main Authors: Warren, W. L., Vanheusden, K., Tallant, D. R., Seager, C. H., Sun, S.-S., Evans, D. R., Dennis, W. M., Soininen, Erkki, Bullington, J. A.
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We find that the Ce3+ ion in polycrystalline sputtered SrS:Ce thin films resides in a distorted octahedral environment, as opposed to the cubic host environment. Using electron paramagnetic resonance and x-ray diffraction analysis, we show that the degree of axial distortion is related to the preferential growth direction of the SrS films. To first order, the blue-emission properties (emission wavelength and decay times) of the SrS:Ce films do not appear to be affected by the amount of distortion in the local Ce3+ environment.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.366284