Virtual charge method for electrostatic calculations in metallic tip and semiconducting sample systems

We calculate the electrostatic field between a metallic tip and a semiconductor surface by replacing the electrodes by a set of virtual charges, adjusted to fit the boundary conditions on the surfaces. The boundary conditions on the semiconductor side of the surface are obtained by using the result...

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Bibliographic Details
Published in:Journal of applied physics 1997-12, Vol.82 (11), p.5589-5596
Main Authors: de la Broı̈se, X., Lannoo, M., Delerue, C.
Format: Article
Language:English
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Summary:We calculate the electrostatic field between a metallic tip and a semiconductor surface by replacing the electrodes by a set of virtual charges, adjusted to fit the boundary conditions on the surfaces. The boundary conditions on the semiconductor side of the surface are obtained by using the result of a direct integration of the Poisson equation. The results of the method are compared to those given by a one-dimensional model. It is then applied to get some information which is useful in the theory of near field microscopy: Curvature of the energy bands at the semiconductor surface, influence of the tip shape, range of the electric field, effect of a dielectric insulating layer.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.366419