Sensitivity analysis of transient measurements using the microwave cavity perturbation technique

The application of microwave cavity perturbation technique for the study of transients in semiconductors is becoming popular due to its simplicity in measurement procedure and high sensitivity. This paper discusses the effects of quality factor, sample size, and coupling factor on the sensitivity of...

Full description

Saved in:
Bibliographic Details
Published in:Journal of applied physics 1998-01, Vol.83 (2), p.837-842
Main Authors: Subramanian, V., Murthy, V. R. K., Sobhanadri, J.
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The application of microwave cavity perturbation technique for the study of transients in semiconductors is becoming popular due to its simplicity in measurement procedure and high sensitivity. This paper discusses the effects of quality factor, sample size, and coupling factor on the sensitivity of the measurement. Also, it deals with a measurement approach for the study of triplet state transitions and excited state studies in organic solvents. Finally, a comparison between the cavity perturbation technique and the currently used reflection technique is made.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.366765