Dependence of spontaneous polarization on stacking sequence in SiC revealed by local Schottky barrier height variations over a partially formed 8H-SiC layer on a 4H-SiC substrate

Ballistic electron emission microscopy was used to measure the increase of local Schottky barrier (compared to the surrounding 4H-SiC area) over a partial 8H-SiC layer that is the surface-exposed tail of an 8H stacking fault inclusion extending from 4H substrate. This local increase is believed to b...

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Bibliographic Details
Published in:Applied physics letters 2011-12, Vol.99 (25), p.252102-252102-4
Main Authors: Park, Kibog, Seok Go, Heung, Jeon, Youngeun, Pelz, Jonathan P., Zhang, Xuan, Skowronski, Marek
Format: Article
Language:English
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Summary:Ballistic electron emission microscopy was used to measure the increase of local Schottky barrier (compared to the surrounding 4H-SiC area) over a partial 8H-SiC layer that is the surface-exposed tail of an 8H stacking fault inclusion extending from 4H substrate. This local increase is believed to be due to polarization charge induced at the interface of partial 8H layer and underlying 4H host, resulting from the spontaneous polarization (SP) difference between SiC regions with different bilayer stacking. This is a direct experimental probe of the dependence of SP in SiC on local stacking sequence by measuring carrier transport.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.3670329