Nanoscale density fluctuations in swift heavy ion irradiated amorphous SiO2

We report on the observation of nanoscale density fluctuations in 2 μm thick amorphous SiO2 layers irradiated with 185 MeV Au ions. At high fluences, in excess of approximately 5 × 1012 ions/cm2, where the surface is completely covered by ion tracks, synchrotron small angle x-ray scattering measurem...

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Bibliographic Details
Published in:Journal of applied physics 2011-12, Vol.110 (12)
Main Authors: Kluth, P., Pakarinen, O. H., Djurabekova, F., Giulian, R., Ridgway, M. C., Byrne, A. P., Nordlund, K.
Format: Article
Language:English
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Summary:We report on the observation of nanoscale density fluctuations in 2 μm thick amorphous SiO2 layers irradiated with 185 MeV Au ions. At high fluences, in excess of approximately 5 × 1012 ions/cm2, where the surface is completely covered by ion tracks, synchrotron small angle x-ray scattering measurements reveal the existence of a steady state of density fluctuations. In agreement with molecular dynamics simulations, this steady state is consistent with an ion track “annihilation” process, where high-density regions generated in the periphery of new tracks fill in low-density regions located at the center of existing tracks.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.3671614