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High-responsivity GeSn short-wave infrared p-i-n photodetectors
Surface-illuminated GeSn p-i-n photodetectors (PDs) with Ge0.964Sn0.036 active layer on Ge substrate were fabricated. Photodetection up to 1.95 μm is achieved with a responsivity of 0.13 A/W. High responsivities of 0.56 and 0.71 A/W were achieved under a reverse bias voltage of 3 V at 1640 and 1790 ...
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Published in: | Applied physics letters 2013-04, Vol.102 (14) |
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container_title | Applied physics letters |
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creator | Zhang, Dongliang Xue, Chunlai Cheng, Buwen Su, Shaojian Liu, Zhi Zhang, Xu Zhang, Guangze Li, Chuanbo Wang, Qiming |
description | Surface-illuminated GeSn p-i-n photodetectors (PDs) with Ge0.964Sn0.036 active layer on Ge substrate were fabricated. Photodetection up to 1.95 μm is achieved with a responsivity of 0.13 A/W. High responsivities of 0.56 and 0.71 A/W were achieved under a reverse bias voltage of 3 V at 1640 and 1790 nm, respectively. A low dark current of 1.08 μA was obtained at a reverse bias of 1 V with a diameter of 150 μm, which corresponds to a current density of 6.1 mA/cm2. This value is among the lowest dark current densities reported among GeSn PDs. |
doi_str_mv | 10.1063/1.4801957 |
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title | High-responsivity GeSn short-wave infrared p-i-n photodetectors |
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