Characterizing formation of interfacial domain wall and exchange coupling strength in laminated exchange coupled composites

We have studied the N-dependent switching behavior of composite magnets, comprised of a hard CoPtCr-SiO2 (CPCS) film and a laminated soft [Pt/CPCS]N multilayer. First order reversal curve magnetometry provides evidence of interfacial domain wall (iDW) assisted reversal for N ≥ 5. The magnetic depth...

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Bibliographic Details
Published in:Applied physics letters 2013-04, Vol.102 (16)
Main Authors: Hou, H.-C., Kirby, B. J., Gao, K. Z., Lai, C.-H.
Format: Article
Language:English
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Summary:We have studied the N-dependent switching behavior of composite magnets, comprised of a hard CoPtCr-SiO2 (CPCS) film and a laminated soft [Pt/CPCS]N multilayer. First order reversal curve magnetometry provides evidence of interfacial domain wall (iDW) assisted reversal for N ≥ 5. The magnetic depth profiles determined from polarized neutron reflectometry (PNR) explicitly demonstrate that the composite magnets are more rigidly coupled for N = 3 than for N = 7, and suggest that for N = 7 reversal occurs via formation of iDW. By fitting the PNR profile into the energy surface calculations, we can further deduce the vertical coupling strength in the laminated soft layer.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4803038