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Identifying the influence of the intrinsic defects in Gd-doped ZnO thin-films

Gd-doped ZnO thin films were prepared using pulsed laser deposition at different oxygen pressures and varied Gd concentrations. The effects of oxygen deficiency-related defects on the Gd incorporation, optical and structural properties, were explored by studying the impact of oxygen pressure during...

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Published in:Journal of applied physics 2016-02, Vol.119 (6)
Main Authors: Flemban, T. H., Sequeira, M. C., Zhang, Z., Venkatesh, S., Alves, E., Lorenz, K., Roqan, I. S.
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cited_by cdi_FETCH-LOGICAL-c362t-956cf158bc016e9477f8ca39f343ef574842393d205c8cc2663c670d4c3b6c023
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container_title Journal of applied physics
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description Gd-doped ZnO thin films were prepared using pulsed laser deposition at different oxygen pressures and varied Gd concentrations. The effects of oxygen deficiency-related defects on the Gd incorporation, optical and structural properties, were explored by studying the impact of oxygen pressure during deposition and post-growth thermal annealing in vacuum. Rutherford Backscattering Spectrometry revealed that the Gd concentration increases with increasing oxygen pressure for samples grown with the same Gd-doped ZnO target. Unexpectedly, the c-lattice parameter of the samples tends to decrease with increasing Gd concentration, suggesting that Gd-defect complexes play an important role in the structural properties. Using low-temperature photoluminescence (PL), Raman measurements and density functional theory calculations, we identified oxygen vacancies as the dominant intrinsic point defects. PL spectra show a defect band related to oxygen vacancies for samples grown at oxygen deficiency.
doi_str_mv 10.1063/1.4941434
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source American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)
subjects Applied physics
Backscattering
Density functional theory
Gadolinium
Lattice vacancies
Optical properties
Oxygen
Photoluminescence
Point defects
Pulsed laser deposition
Pulsed lasers
Thin films
Zinc oxide
title Identifying the influence of the intrinsic defects in Gd-doped ZnO thin-films
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