Imaging and spectromicroscopy of photocarrier electron dynamics in C60 fullerene thin films

We have employed a two-photon photoelectron emission microscopy (2P-PEEM) to observe the photocarrier electron dynamics in an organic thin film of fullerene (C60) formed on a highly oriented pyrolytic graphite with a spatial resolution of ca. 135 nm. In this approach, photocarrier electrons in C60 s...

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Bibliographic Details
Published in:Applied physics letters 2016-11, Vol.109 (20)
Main Authors: Shibuta, Masahiro, Yamagiwa, Kana, Eguchi, Toyoaki, Nakajima, Atsushi
Format: Article
Language:English
Subjects:
Applied physics
Buckminsterfullerene
Electrons
Emission microscopy
Fullerenes
Islands
Photoelectric emission
Pyrolytic graphite
Spatial resolution
Substrates
Thin films
Time constant
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Summary:We have employed a two-photon photoelectron emission microscopy (2P-PEEM) to observe the photocarrier electron dynamics in an organic thin film of fullerene (C60) formed on a highly oriented pyrolytic graphite with a spatial resolution of ca. 135 nm. In this approach, photocarrier electrons in C60 single-layer islands generated by the first pump photon are detected by the second probe photon. These spectromicroscopic observations conducted over a 100 × 100 nm2 region of C60 islands consistently reproduced the macroscopic two-photon photoemission spectrum of fully covered C60 monolayer film, where the energy of photocarrier electron in the islands was +0.9 eV relative to the Fermi level. Time-resolved 2P-PEEM revealed that the photocarrier electron decayed from the monolayered C60 islands into the substrate with a time constant of 470 ± 30 fs.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4967380