Non-contact temperature field measurement of solids by infrared multispectral thermotransmittance

This work aims to achieve contactless absolute-temperature measurements of infrared-semi-transparent solids using an infrared thermal and spectroscopic imaging technique. The multispectral thermo-transmittance coefficient fields in the 3–5 μm wavelength range for Sapphire, KBr, and Silicon are deter...

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Bibliographic Details
Published in:Journal of applied physics 2017-02, Vol.121 (8)
Main Authors: Pradere, C., Ryu, M., Sommier, A., Romano, M., Kusiak, A., Battaglia, J. L., Batsale, J. C., Morikawa, J.
Format: Article
Language:English
Subjects:
Applied physics
Coefficients
Engineering Sciences
Infrared imaging
Room temperature
Sapphire
Temperature dependence
Temperature distribution
Thermal imaging
Transmittance
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Summary:This work aims to achieve contactless absolute-temperature measurements of infrared-semi-transparent solids using an infrared thermal and spectroscopic imaging technique. The multispectral thermo-transmittance coefficient fields in the 3–5 μm wavelength range for Sapphire, KBr, and Silicon are determined to be 6 × 10−4 K−1, 4 × 10−4 K−1, and −3 × 10−3 K−1, respectively. The most interesting result is the high temperature-dependent transmittance coefficient in the middle wave infrared region. With these coefficients, the absolute temperature fields in a range from room temperature to 140 °C are shown.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.4976209