Relaxation mechanisms in a gold thin film on a compliant substrate as revealed by X-ray diffraction

The fact that the polymeric substrate does not relax after a load jump allows realizing an original relaxation experiment of a metallic thin film. Thanks to the combination of two strain probes done at different scales, namely, X-ray synchrotron diffraction and digital image correlation techniques,...

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Bibliographic Details
Published in:Applied physics letters 2017-05, Vol.110 (21)
Main Authors: Godard, Pierre, Renault, Pierre-Olivier, Faurie, Damien, Thiaudière, Dominique
Format: Article
Language:English
Subjects:
Applied physics
Deformation
Deformation mechanisms
Digital imaging
Engineering Sciences
Gold
Physics
Substrates
Thin films
X-ray diffraction
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Summary:The fact that the polymeric substrate does not relax after a load jump allows realizing an original relaxation experiment of a metallic thin film. Thanks to the combination of two strain probes done at different scales, namely, X-ray synchrotron diffraction and digital image correlation techniques, the apparent activation volumes are monitored and their values help to capture leading deformation mechanisms in thin films. Such experiments have been performed on a nanocrystalline gold thin film, and deformation mechanisms involved during a biaxial straining have been distinguished between different texture components.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4984135