Loading…
Optical sectioning with a Wiener-like filter in Fourier integral imaging microscopy
Non-scanning, single-shot, 3D integral microscopy with optical sectioning is presented. The method is based on the combination of Fourier-mode integral microscopy with a 3D deconvolution technique. Specifically, the refocused volume provided by a regular back-projection algorithm is 3D deconvolved w...
Saved in:
| Published in: | Applied physics letters 2018-11, Vol.113 (21) |
|---|---|
| Main Authors: | , , , , |
| Format: | Article |
| Language: | English |
| Citations: | Items that this one cites Items that cite this one |
| Online Access: | Get full text |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| cited_by | cdi_FETCH-LOGICAL-c334t-9b464a6faff5711237db148e40e0f5bcf4c7ec166f003c34d1779cffc12ed3d53 |
|---|---|
| cites | cdi_FETCH-LOGICAL-c334t-9b464a6faff5711237db148e40e0f5bcf4c7ec166f003c34d1779cffc12ed3d53 |
| container_end_page | |
| container_issue | 21 |
| container_start_page | |
| container_title | Applied physics letters |
| container_volume | 113 |
| creator | Sánchez-Ortiga, E. Llavador, A. Saavedra, G. García-Sucerquia, J. Martínez-Corral, M. |
| description | Non-scanning, single-shot, 3D integral microscopy with optical sectioning is presented.
The method is based on the combination of Fourier-mode integral microscopy with a 3D
deconvolution technique. Specifically, the refocused volume provided by a regular
back-projection algorithm is 3D deconvolved with a synthetic 3D impulse response function
that takes into account the number and positions of the elemental images. The use of this
hybrid technique provides a stack of true-color depth-refocused images with significant
gain of optical sectioning. The stack can be used, among other applications, to inspect
inside the thick microscope specimen, to calculate collections of perspective views with
fine angular resolution and extended full parallax, and also to display 3D images in an
integral monitor. The method here presented is validated with both simulation and
experimental data. |
| doi_str_mv | 10.1063/1.5049755 |
| format | article |
| fullrecord | <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_5049755</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>apl</sourcerecordid><originalsourceid>FETCH-LOGICAL-c334t-9b464a6faff5711237db148e40e0f5bcf4c7ec166f003c34d1779cffc12ed3d53</originalsourceid><addsrcrecordid>eNp9kEFLxDAQhYMouK4e_Ae5KmTNNEmzPcriqrCwBxWPIU2TGu22JYnK_ntbd9GD4Glm4Htv3gxC50BnQHN2BTNBeSGFOEAToFISBjA_RBNKKSN5IeAYncT4OowiY2yCHtZ98kY3OFqTfNf6tsafPr1gjZ-9bW0gjX-z2Pkm2YB9i5fde_DfbbJ1GIR-o-tRtfEmdNF0_fYUHTndRHu2r1P0tLx5XNyR1fr2fnG9IoYxnkhR8pzr3GnnhATImKxK4HPLqaVOlMZxI62BPHdDdsN4BVIWxjkDma1YJdgUXex8x8UxWKf6MKQJWwVUjd9QoPbfGNjLHRuNT3q89Af-6MIvqPrK_Qf_df4CcIBvIA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Optical sectioning with a Wiener-like filter in Fourier integral imaging microscopy</title><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><source>American Institute of Physics(アメリカ物理学協会)</source><creator>Sánchez-Ortiga, E. ; Llavador, A. ; Saavedra, G. ; García-Sucerquia, J. ; Martínez-Corral, M.</creator><creatorcontrib>Sánchez-Ortiga, E. ; Llavador, A. ; Saavedra, G. ; García-Sucerquia, J. ; Martínez-Corral, M.</creatorcontrib><description>Non-scanning, single-shot, 3D integral microscopy with optical sectioning is presented.
The method is based on the combination of Fourier-mode integral microscopy with a 3D
deconvolution technique. Specifically, the refocused volume provided by a regular
back-projection algorithm is 3D deconvolved with a synthetic 3D impulse response function
that takes into account the number and positions of the elemental images. The use of this
hybrid technique provides a stack of true-color depth-refocused images with significant
gain of optical sectioning. The stack can be used, among other applications, to inspect
inside the thick microscope specimen, to calculate collections of perspective views with
fine angular resolution and extended full parallax, and also to display 3D images in an
integral monitor. The method here presented is validated with both simulation and
experimental data.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.5049755</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><ispartof>Applied physics letters, 2018-11, Vol.113 (21)</ispartof><rights>Author(s)</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c334t-9b464a6faff5711237db148e40e0f5bcf4c7ec166f003c34d1779cffc12ed3d53</citedby><cites>FETCH-LOGICAL-c334t-9b464a6faff5711237db148e40e0f5bcf4c7ec166f003c34d1779cffc12ed3d53</cites><orcidid>0000-0002-1449-8976</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.5049755$$EHTML$$P50$$Gscitation$$Hfree_for_read</linktohtml><link.rule.ids>314,780,782,784,795,27922,27923,76153</link.rule.ids></links><search><creatorcontrib>Sánchez-Ortiga, E.</creatorcontrib><creatorcontrib>Llavador, A.</creatorcontrib><creatorcontrib>Saavedra, G.</creatorcontrib><creatorcontrib>García-Sucerquia, J.</creatorcontrib><creatorcontrib>Martínez-Corral, M.</creatorcontrib><title>Optical sectioning with a Wiener-like filter in Fourier integral imaging microscopy</title><title>Applied physics letters</title><description>Non-scanning, single-shot, 3D integral microscopy with optical sectioning is presented.
The method is based on the combination of Fourier-mode integral microscopy with a 3D
deconvolution technique. Specifically, the refocused volume provided by a regular
back-projection algorithm is 3D deconvolved with a synthetic 3D impulse response function
that takes into account the number and positions of the elemental images. The use of this
hybrid technique provides a stack of true-color depth-refocused images with significant
gain of optical sectioning. The stack can be used, among other applications, to inspect
inside the thick microscope specimen, to calculate collections of perspective views with
fine angular resolution and extended full parallax, and also to display 3D images in an
integral monitor. The method here presented is validated with both simulation and
experimental data.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><sourceid>AJDQP</sourceid><recordid>eNp9kEFLxDAQhYMouK4e_Ae5KmTNNEmzPcriqrCwBxWPIU2TGu22JYnK_ntbd9GD4Glm4Htv3gxC50BnQHN2BTNBeSGFOEAToFISBjA_RBNKKSN5IeAYncT4OowiY2yCHtZ98kY3OFqTfNf6tsafPr1gjZ-9bW0gjX-z2Pkm2YB9i5fde_DfbbJ1GIR-o-tRtfEmdNF0_fYUHTndRHu2r1P0tLx5XNyR1fr2fnG9IoYxnkhR8pzr3GnnhATImKxK4HPLqaVOlMZxI62BPHdDdsN4BVIWxjkDma1YJdgUXex8x8UxWKf6MKQJWwVUjd9QoPbfGNjLHRuNT3q89Af-6MIvqPrK_Qf_df4CcIBvIA</recordid><startdate>20181119</startdate><enddate>20181119</enddate><creator>Sánchez-Ortiga, E.</creator><creator>Llavador, A.</creator><creator>Saavedra, G.</creator><creator>García-Sucerquia, J.</creator><creator>Martínez-Corral, M.</creator><scope>AJDQP</scope><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0002-1449-8976</orcidid></search><sort><creationdate>20181119</creationdate><title>Optical sectioning with a Wiener-like filter in Fourier integral imaging microscopy</title><author>Sánchez-Ortiga, E. ; Llavador, A. ; Saavedra, G. ; García-Sucerquia, J. ; Martínez-Corral, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c334t-9b464a6faff5711237db148e40e0f5bcf4c7ec166f003c34d1779cffc12ed3d53</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sánchez-Ortiga, E.</creatorcontrib><creatorcontrib>Llavador, A.</creatorcontrib><creatorcontrib>Saavedra, G.</creatorcontrib><creatorcontrib>García-Sucerquia, J.</creatorcontrib><creatorcontrib>Martínez-Corral, M.</creatorcontrib><collection>AIP Open Access Journals</collection><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Sánchez-Ortiga, E.</au><au>Llavador, A.</au><au>Saavedra, G.</au><au>García-Sucerquia, J.</au><au>Martínez-Corral, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optical sectioning with a Wiener-like filter in Fourier integral imaging microscopy</atitle><jtitle>Applied physics letters</jtitle><date>2018-11-19</date><risdate>2018</risdate><volume>113</volume><issue>21</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>Non-scanning, single-shot, 3D integral microscopy with optical sectioning is presented.
The method is based on the combination of Fourier-mode integral microscopy with a 3D
deconvolution technique. Specifically, the refocused volume provided by a regular
back-projection algorithm is 3D deconvolved with a synthetic 3D impulse response function
that takes into account the number and positions of the elemental images. The use of this
hybrid technique provides a stack of true-color depth-refocused images with significant
gain of optical sectioning. The stack can be used, among other applications, to inspect
inside the thick microscope specimen, to calculate collections of perspective views with
fine angular resolution and extended full parallax, and also to display 3D images in an
integral monitor. The method here presented is validated with both simulation and
experimental data.</abstract><doi>10.1063/1.5049755</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0002-1449-8976</orcidid><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 2018-11, Vol.113 (21) |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_5049755 |
| source | American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list); American Institute of Physics(アメリカ物理学協会) |
| title | Optical sectioning with a Wiener-like filter in Fourier integral imaging microscopy |
| url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T13%3A49%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Optical%20sectioning%20with%20a%20Wiener-like%20filter%20in%20Fourier%20integral%20imaging%20microscopy&rft.jtitle=Applied%20physics%20letters&rft.au=S%C3%A1nchez-Ortiga,%20E.&rft.date=2018-11-19&rft.volume=113&rft.issue=21&rft.issn=0003-6951&rft.eissn=1077-3118&rft.coden=APPLAB&rft_id=info:doi/10.1063/1.5049755&rft_dat=%3Cscitation_cross%3Eapl%3C/scitation_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c334t-9b464a6faff5711237db148e40e0f5bcf4c7ec166f003c34d1779cffc12ed3d53%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |