In-house setup for laboratory-based x-ray absorption fine structure spectroscopy measurements

We report on a laboratory-based facility for in-house x-ray absorption fine structure (XAFS) measurements. The device consists of a conventional x-ray source for the production of the incident polychromatic radiation and a von Hamos bent crystal spectrometer for the analysis of the incoming and tran...

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Bibliographic Details
Published in:Review of scientific instruments 2019-07, Vol.90 (7), p.073105-073105
Main Authors: Zeeshan, F., Hoszowska, J., Loperetti-Tornay, L., Dousse, J.-Cl
Format: Article
Language:English
Subjects:
Absorption spectra
Attenuation coefficients
Dependence
Fine structure
Iron oxides
Laboratories
Oxidation
Reliability analysis
Scientific apparatus & instruments
Spectrum analysis
Synchrotron radiation
Tantalum
Valence
X ray absorption
X ray sources
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Summary:We report on a laboratory-based facility for in-house x-ray absorption fine structure (XAFS) measurements. The device consists of a conventional x-ray source for the production of the incident polychromatic radiation and a von Hamos bent crystal spectrometer for the analysis of the incoming and transmitted radiation. The reliability of the laboratory-based setup was evaluated by comparing the Cu K-edge and Ta L3-edge XAFS spectra obtained in-house with the corresponding spectra measured at a synchrotron radiation facility. To check the accuracy of the device, the K- and L-edge energies and the attenuation coefficients below and above the edges of several 3d, 4d, and 5d elements were determined and compared with the existing experimental and theoretical data. The dependence of the XAFS spectrum shape on the oxidation state of the sample was also probed by measuring inhouse the absorption spectra of metallic Fe and two Fe oxides (Fe2O3 and Fe3O4).
ISSN:0034-6748
1089-7623
DOI:10.1063/1.5094873