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Combined Rayleigh and Raman scattering study of Al x Ga1− x As grown via molecular beam epitaxy under reflection high-energy electron diffraction determined growth conditions
Rayleigh and Raman scattering studies reveal a direct correlation between the degree of disorder and growth kinetics attendant to the chosen growth conditions in molecular beam epitaxial growth. This inference is derived from studies on AlxGa1−xAs alloys grown under growth conditions indicated by re...
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Published in: | Applied physics letters 1988-01, Vol.52 (1), p.42-44 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Rayleigh and Raman scattering studies reveal a direct correlation between the degree of disorder and growth kinetics attendant to the chosen growth conditions in molecular beam epitaxial growth. This inference is derived from studies on AlxGa1−xAs alloys grown under growth conditions indicated by reflection high-energy electron diffraction intensity dynamics to be near optimal and away from optimal. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.99311 |