Publisher’s Note: “On the resolution of subsurface atomic force microscopy and its implications for subsurface feature sizing” [Rev. Sci. Instrum. 91, 083702 (2020)]

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Bibliographic Details
Published in:Review of scientific instruments 2020-09, Vol.91 (9), p.099902-099902
Main Authors: Piras, Daniele, van Neer, Paul L. M. J., Thijssen, Rutger M. T., Sadeghian, Hamed
Format: Article
Language:English
Subjects:
Atomic force microscopy
Scientific apparatus & instruments
Online Access:Get full text
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ISSN:0034-6748
1089-7623
DOI:10.1063/5.0025011