Local C–V mapping for ferroelectrics using scanning nonlinear dielectric microscopy

Detailed analysis of local polarization switching will promote the further development of a wide range of applications using ferroelectrics. Here, we propose a local C– V mapping technique using scanning nonlinear dielectric microscopy (SNDM) that enables visualization of dynamic ferroelectric switc...

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Bibliographic Details
Published in:Journal of applied physics 2020-12, Vol.128 (24)
Main Authors: Hiranaga, Yoshiomi, Mimura, Takanori, Shimizu, Takao, Funakubo, Hiroshi, Cho, Yasuo
Format: Article
Language:English
Subjects:
Applied physics
Curves
Domain walls
Electric fields
Ferroelectric materials
Ferroelectricity
Ferroelectrics
Mapping
Microscopy
Nonlinear analysis
Polarization
Scanning probe microscopy
Single crystals
Switching
Thin films
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Summary:Detailed analysis of local polarization switching will promote the further development of a wide range of applications using ferroelectrics. Here, we propose a local C– V mapping technique using scanning nonlinear dielectric microscopy (SNDM) that enables visualization of dynamic ferroelectric switching behavior in real space. Using this method, C– V butterfly curves characteristic of ferroelectrics can be measured on a scanning probe microscopy platform with nanoscale resolution by virtue of the high capacitance-detection sensitivity of SNDM. This provides real-space mapping of the net switchable polarization, the switching voltage, and the local imprint with a short measurement time (e.g., 10 min or less for 256 × 256 pixels). Furthermore, the proposed method will be useful for study of the electric-field response of domain walls. In this paper, we present some examples of experiments with LiTaO 3 single crystals and HfO 2-based ferroelectric thin films and give an overview of what kind of evaluation is possible with the local C– V mapping technique.
ISSN:0021-8979
1089-7550
DOI:10.1063/5.0029630