Electron thermalization length in solid para-hydrogen at low-temperature

We report the first ever measurements of the thermalization length of low-energy electrons injected into solid para-hydrogen at a temperature T ≈ 2.8 K. The use of the pulsed Townsend photoinjection technique has allowed us to investigate the behavior of quasi-free electrons rather than of massive,...

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Bibliographic Details
Published in:The Journal of chemical physics 2023-09, Vol.159 (10)
Main Authors: Borghesani, A. F., Carugno, G., Messineo, G., Pazzini, J.
Format: Article
Language:English
Subjects:
Free electrons
Hydrogen
Liquid helium
Low temperature
Physics
Thermalization (energy absorption)
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Summary:We report the first ever measurements of the thermalization length of low-energy electrons injected into solid para-hydrogen at a temperature T ≈ 2.8 K. The use of the pulsed Townsend photoinjection technique has allowed us to investigate the behavior of quasi-free electrons rather than of massive, slow negative charges, as reported in all previous literature. We have found an average thermalization length ⟨z0⟩ = 26.1 nm, which is three to five times longer than that in liquid helium at the same temperature.
ISSN:0021-9606
1089-7690
DOI:10.1063/5.0163776