Design and fabrication of a sandwich detector for material discrimination and contrast cancellation in dual-energy based x-ray imaging

• Published in: Journal of applied physics 2024-04, Vol.135 (15)
• Main Authors: Alikunju, Rimcy Palakkappilly, Buchanan, Ian, Esposito, Michela, Morehen, Jason, Khan, Asmar, Stamatis, Yiannis, Iacovou, Nicolas, Bullard, Edward, Anaxagoras, Thalis, Brodrick, James, Olivo, Alessandro
• Format: Article
• Language: English
• Subjects: CMOS; Energy; Multilayers; Pixels; Scintillation counters; Sensors; Simulation models; Thickness; X ray imagery
• ISSN: 0021-8979; 1089-7550
• DOI: 10.1063/5.0200269

Dual-energy imaging represents a versatile and evolving technology with wide-ranging applications in medicine and beyond. Recent technological developments increased the potential for improved diagnostic accuracy and expanded imaging capabilities across various fields. The purpose of this work is to design and develop an energy-integrating multilayer detector, known as a sandwich detector, aimed at single-shot dual-energy imaging tasks such as material discrimination and contrast cancellation. The sandwich detector uses two complementary metal oxide semiconductor advanced pixel sensors of 50 μm pixel size. The top and bottom sensors detect low-energy (LE) and high-energy (HE) photons, with sensors coupled with 250 and 600 μm scintillators, respectively. For better spectral separation between layers without excessively affecting the detected statistic in the bottom layer, the insertion of a 0.25-mm Cu filter between the layers was found to be the optimal choice, from among the tested 0-, 0.25-, and 0.5-mm filter options. The thickness selection for scintillator and intermediate Cu filter was carried out through a dual-energy simulation model. The experiments confirmed the model's reliability in selecting the optimal thicknesses of the intermediate Cu filter, thereby providing reassurance also on the choice of the top scintillator.